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Doug Matheson
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Allen, TX, US
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last 30 patents
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Patent Grant
Chemical etch solution and technique for imaging a device's shallow...
Patent number
7,262,409
Issue date
Aug 28, 2007
Texas Instruments Incorporated
Lancy Y. Tsung
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Chemical etch solution and technique for imaging a device's shallow...
Publication number
20080011717
Publication date
Jan 17, 2008
TEXAS INSTRUMENTS INCORPORATED
Lancy Y. Tsung
G01 - MEASURING TESTING
Information
Patent Application
Chemical etch solution and technique for imaging a device's shallow...
Publication number
20060145073
Publication date
Jul 6, 2006
Texas Instruments, Inc.
Lancy Y. Tsung
G01 - MEASURING TESTING