Douglas A. Guddat

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Programmable weak write test mode
- Patent number 6,778,450
- Issue date Aug 17, 2004
- Intel Corporation
- Eric B. Selvin
- G11 - INFORMATION STORAGE
Information Patent Grant
Low yield analysis of embedded memory
- Patent number 6,374,377
- Issue date Apr 16, 2002
- Intel Corporation
- Douglas A. Guddat
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for software controlled timing of embedded memory
- Patent number 6,366,990
- Issue date Apr 2, 2002
- Intel Corporation
- Douglas A. Guddat
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for direct access test of embedded memory
- Patent number 6,185,703
- Issue date Feb 6, 2001
- Intel Corporation
- Douglas A. Guddat
- G11 - INFORMATION STORAGE
Information Patent Grant
Static random access memory SRAM having weak write test circuit
- Patent number 5,559,745
- Issue date Sep 24, 1996
- Intel Corporation
- Jashojiban Banik
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for generating self-timing for on-chip cache
- Patent number 5,031,141
- Issue date Jul 9, 1991
- Intel Corporation
- Douglas Guddat
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Programmable weak write test mode
- Publication number 20030210593
- Publication date Nov 13, 2003
- Eric B. Selvin
- G11 - INFORMATION STORAGE