Douglas C. Heaberlin

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Underhill, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Exhaustive diagnosis of bridging defects in an integrated circuit i...
- Patent number 7,352,170
- Issue date Apr 1, 2008
- International Business Machines Corporation
- Douglas C. Heaberlin
- G01 - MEASURING TESTING
Information Patent Grant
Method for locating IDDQ defects using multiple controlled collapse...
- Patent number 7,064,570
- Issue date Jun 20, 2006
- International Business Machines, Corporation
- Patrick H. Buffet
- G01 - MEASURING TESTING
Information Patent Grant
Internal cache for on chip test data storage
- Patent number 6,901,542
- Issue date May 31, 2005
- International Business Machines Corporation
- Thomas W. Bartenstein
- G11 - INFORMATION STORAGE
Information Patent Grant
Diagnosis of combinational logic circuit failures
- Patent number 6,721,914
- Issue date Apr 13, 2004
- International Business Machines Corporation
- Thomas W. Bartenstein
- G01 - MEASURING TESTING
Information Patent Grant
Method for locating IDDQ defects using multiple controlled collapse...
- Patent number 6,677,774
- Issue date Jan 13, 2004
- International Business Machines Corporation
- Patrick H. Buffet
- G01 - MEASURING TESTING
Information Patent Grant
Incremental fault dictionary
- Patent number 6,675,323
- Issue date Jan 6, 2004
- International Business Machines Corporation
- Thomas W. Bartenstein
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
EXHAUSTIVE DIAGNOSIS OF BRIDGING DEFECTS IN AN INTEGRATED CIRCUIT
- Publication number 20070296443
- Publication date Dec 27, 2007
- Douglas C. Heaberlin
- G01 - MEASURING TESTING
Information Patent Application
Method for locating IDDQ defects using multiple controlled collapse...
- Publication number 20040061519
- Publication date Apr 1, 2004
- Patrick H. Buffet
- G01 - MEASURING TESTING
Information Patent Application
Incremental fault dictionary
- Publication number 20030046608
- Publication date Mar 6, 2003
- Thomas W. Bartenstein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Internal cache for on chip test data storage
- Publication number 20030033566
- Publication date Feb 13, 2003
- International Business Machines Corporation
- Thomas W. Bartenstein
- G11 - INFORMATION STORAGE
Information Patent Application
Method for locating IDDQ defects using multiple controlled collapse...
- Publication number 20020196042
- Publication date Dec 26, 2002
- Patrick H. Buffet
- G01 - MEASURING TESTING
Information Patent Application
Diagnosis of combinational logic circuit failures
- Publication number 20020147952
- Publication date Oct 10, 2002
- International Business Machines Corporation
- Thomas W. Bartenstein
- G01 - MEASURING TESTING