Douglas Goodman

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Tucson, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Prognostic cell for predicting failure of integrated circuits
- Patent number 7,271,608
- Issue date Sep 18, 2007
- Ridgetop Group, Inc.
- Bert M. Vermeire
- G01 - MEASURING TESTING
Information Patent Grant
Die-level process monitor and method
- Patent number 7,239,163
- Issue date Jul 3, 2007
- Ridgetop Group, Inc.
- Jeremy John Ralston-Good
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing a system-on-a-chip
- Patent number 6,964,004
- Issue date Nov 8, 2005
- Ardext Technologies, Inc.
- Abhijit Chatterjee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FREQUENCY-SAMPLING CIRCUIT AND METHOD FOR HEALTH PROGNOSTICS
- Publication number 20120232814
- Publication date Sep 13, 2012
- Ridgetop Group, Inc.
- James P. Hofmeister
- G01 - MEASURING TESTING
Information Patent Application
Prognostic-Enabled Power System
- Publication number 20110190956
- Publication date Aug 4, 2011
- Neil Kunst
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for testing a system-on-a-chip
- Publication number 20030158688
- Publication date Aug 21, 2003
- Abhijit Chatterjee
- G01 - MEASURING TESTING