Douglas M. Riechers

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Richland, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for detecting and/or measuring flaws in conduc...
- Patent number 6,014,024
- Issue date Jan 11, 2000
- Battelle Memorial Institute
- Ronald L. Hockey
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting flaws in conductive material
- Patent number 5,986,452
- Issue date Nov 16, 1999
- Battelle Memorial Institute
- Ronald L. Hockey
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting flaws in conductive material
- Patent number 5,777,469
- Issue date Jul 7, 1998
- Battelle Memorial Institute
- Ronald L. Hockey
- G01 - MEASURING TESTING