Douglas Masnaghetti

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for charged particle microscopy with improved ima...
- Patent number 11,120,969
- Issue date Sep 14, 2021
- KLA Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for focus adjustment of a multi-beam scanning ele...
- Patent number 10,861,671
- Issue date Dec 8, 2020
- KLA Corporation
- Doug K. Masnaghetti
- G02 - OPTICS
Information Patent Grant
Method and system for charged particle microscopy with improved ima...
- Patent number 10,643,819
- Issue date May 5, 2020
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- G01 - MEASURING TESTING
Information Patent Grant
Backscattered electrons (BSE) imaging using multi-beam tools
- Patent number 10,460,905
- Issue date Oct 29, 2019
- KLA-Tencor Corporation
- Mark A. McCord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for noise mitigation in a multi-beam scanning ele...
- Patent number 10,366,862
- Issue date Jul 30, 2019
- KLA-Tencor Corporaton
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for focus adjustment of a multi-beam scanning ele...
- Patent number 10,325,753
- Issue date Jun 18, 2019
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam dark field imaging
- Patent number 10,192,716
- Issue date Jan 29, 2019
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for focus adjustment of a multi-beam scanning ele...
- Patent number 10,186,396
- Issue date Jan 22, 2019
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection site preparation
- Patent number 9,165,742
- Issue date Oct 20, 2015
- KLA-Tencor Corporation
- Richard Simmons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect review using image segmentation
- Patent number 7,792,351
- Issue date Sep 7, 2010
- KLA-Tencor Technologies Corporation
- Gabor D. Toth
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect review using image segmentation
- Patent number 7,684,609
- Issue date Mar 23, 2010
- KLA-Tencor Technologies Corporation
- Gabor D. Toth
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transverse magnetic field voltage isolator
- Patent number 7,612,348
- Issue date Nov 3, 2009
- KLA-Technologies Corporation
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chamberless substrate handling
- Patent number 7,550,743
- Issue date Jun 23, 2009
- KLA-Tencor Corporation
- Douglas K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chamberless substrate handling
- Patent number 7,550,744
- Issue date Jun 23, 2009
- KLA-Tencor Corporation
- George R. Koch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transverse magnetic field voltage isolator
- Patent number 7,394,339
- Issue date Jul 1, 2008
- KLA-Tencor Technologies Corporation
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transverse magnetic field voltage isolator
- Patent number 7,288,774
- Issue date Oct 30, 2007
- KLA-Tencor Technologies Corporation
- George R. Koch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for e-beam scanning
- Patent number 7,276,690
- Issue date Oct 2, 2007
- KLA-Tencor Technologies Corporation
- Gian Francesco Lorusso
- G01 - MEASURING TESTING
Information Patent Grant
Automated focusing of electron image
- Patent number 7,247,849
- Issue date Jul 24, 2007
- KLA-Tencor Technologies Corporation
- Gabor D. Toth
- G01 - MEASURING TESTING
Information Patent Grant
Wien filter with reduced chromatic aberration
- Patent number 7,164,139
- Issue date Jan 16, 2007
- KLA-Tencor Technologies Corporation
- Gabor D. Toth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for E-beam dark field imaging
- Patent number 7,141,791
- Issue date Nov 28, 2006
- KLA-Tencor Technologies Corporation
- Douglas K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated focusing of electron image
- Patent number 7,041,976
- Issue date May 9, 2006
- KLA-Tencor Technologies Corporation
- Mark A. Neil
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for e-beam scanning
- Patent number 6,815,675
- Issue date Nov 9, 2004
- KLA-Tencor Technologies Corporation
- Gian Francesco Lorusso
- G01 - MEASURING TESTING
Information Patent Grant
Energy filter multiplexing
- Patent number 6,784,425
- Issue date Aug 31, 2004
- KLA-Tencor Technologies Corporation
- Gian Francesco Lorusso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope architecture and related material hand...
- Patent number 6,710,354
- Issue date Mar 23, 2004
- KLA-Tencor Corporation
- George R. Koch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron beam microscope
- Patent number 6,570,154
- Issue date May 27, 2003
- KLA-Tencor Technologies Corporation
- Douglas K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron beam microscope
- Patent number 6,066,849
- Issue date May 23, 2000
- KLA Tencor
- Douglas K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Insulator deposition using focused ion beam
- Patent number 5,700,526
- Issue date Dec 23, 1997
- Schlumberger Technologies Inc.
- Hongyu Ximen
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Self-masking FIB milling
- Patent number 5,616,921
- Issue date Apr 1, 1997
- Schlumberger Technologies Inc.
- Christopher G. Talbot
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Layout overlay for FIB operations
- Patent number 5,401,972
- Issue date Mar 28, 1995
- Schlumberger Technologies, Inc.
- Christopher G. Talbot
- G01 - MEASURING TESTING
Information Patent Grant
Double-gated integrating scheme for electron beam tester
- Patent number 5,210,487
- Issue date May 11, 1993
- Schlumberger Technologies Inc.
- Hitoshi Takahashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and System for Charged Particle Microscopy with Improved Ima...
- Publication number 20200227232
- Publication date Jul 16, 2020
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Focus Adjustment of a Multi-Beam Scanning Ele...
- Publication number 20190172675
- Publication date Jun 6, 2019
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Focus Adjustment of a Multi-Beam Scanning Ele...
- Publication number 20170084424
- Publication date Mar 23, 2017
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Noise Mitigation in a Multi-Beam Scanning Ele...
- Publication number 20170084423
- Publication date Mar 23, 2017
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Backscattered Electrons (BSE) Imaging Using Multi-Beam Tools
- Publication number 20170084421
- Publication date Mar 23, 2017
- KLA-Tencor Corporation
- Mark A. McCord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Beam Dark Field Imaging
- Publication number 20170084422
- Publication date Mar 23, 2017
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Charged Particle Microscopy with Improved Ima...
- Publication number 20160372304
- Publication date Dec 22, 2016
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for e-beam dark field imaging
- Publication number 20060060780
- Publication date Mar 23, 2006
- Douglas K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS

Douglas Masnaghetti

Person

Patents Grantslast 30 patents

Method and system for charged particle microscopy with improved ima...

Method and system for focus adjustment of a multi-beam scanning ele...

Method and system for charged particle microscopy with improved ima...

Backscattered electrons (BSE) imaging using multi-beam tools

Method and system for noise mitigation in a multi-beam scanning ele...

Method and system for focus adjustment of a multi-beam scanning ele...

Multi-beam dark field imaging

Method and system for focus adjustment of a multi-beam scanning ele...

Inspection site preparation

Defect review using image segmentation

Defect review using image segmentation

Transverse magnetic field voltage isolator

Chamberless substrate handling

Chamberless substrate handling

Transverse magnetic field voltage isolator

Transverse magnetic field voltage isolator

Method and system for e-beam scanning

Automated focusing of electron image

Wien filter with reduced chromatic aberration

Apparatus and method for E-beam dark field imaging

Automated focusing of electron image

Method and system for e-beam scanning

Energy filter multiplexing

Scanning electron microscope architecture and related material hand...

Scanning electron beam microscope

Scanning electron beam microscope

Insulator deposition using focused ion beam

Self-masking FIB milling

Layout overlay for FIB operations

Double-gated integrating scheme for electron beam tester

Patents Applicationslast 30 patents

Method and System for Charged Particle Microscopy with Improved Ima...

Method and System for Focus Adjustment of a Multi-Beam Scanning Ele...

Method and System for Focus Adjustment of a Multi-Beam Scanning Ele...

Method and System for Noise Mitigation in a Multi-Beam Scanning Ele...

Backscattered Electrons (BSE) Imaging Using Multi-Beam Tools

Multi-Beam Dark Field Imaging

Method and System for Charged Particle Microscopy with Improved Ima...

Apparatus and method for e-beam dark field imaging