Douglas W. Babcock

Person

Manchester, NH, US

People

Patents Grantslast 30 patents

Information Patent Grant
T-coil apparatus and method for compensating capacitance
- Patent number 7,470,968
- Issue date Dec 30, 2008
- Analog Devices, Inc.
- Douglas W. Babcock
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test equipment pin channel with T-coil compensation
- Patent number 7,248,035
- Issue date Jul 24, 2007
- Analog Devices, Inc.
- Douglas W. Babcock
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for driving circuit pins in a circuit testing...
- Patent number 6,737,857
- Issue date May 18, 2004
- Analog Devices, Inc.
- Douglas W. Babcock
- G01 - MEASURING TESTING
Information Patent Grant
Circuit testing device using a driver to perform electronics testing
- Patent number 6,677,775
- Issue date Jan 13, 2004
- Analog Devices, Inc.
- Douglas W. Babcock
- G01 - MEASURING TESTING
Information Patent Grant
Parasitic capacitance cancellation circuit
- Patent number 5,434,446
- Issue date Jul 18, 1995
- Analog Devices, Inc.
- Edward B. Hilton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit and method of providing thermal compensation for a transist...
- Patent number 5,424,510
- Issue date Jun 13, 1995
- Analog Devices Inc.
- Alex Gusinov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic test equipment with active load having high-speed inhibit...
- Patent number 5,010,297
- Issue date Apr 23, 1991
- Analog Devices, Incorporated
- Douglas W. Babcock
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
T-coil apparatus and method for compensating capacitance
- Publication number 20060109023
- Publication date May 25, 2006
- Analog Devices, Inc.
- Douglas W. Babcock
- G01 - MEASURING TESTING
Information Patent Application
Automatic test equipment pin channel with T-coil compensation
- Publication number 20040145380
- Publication date Jul 29, 2004
- Analog Devices, Inc.
- Douglas W. Babcock
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for driving circuit pins in a circuit testing...
- Publication number 20020105350
- Publication date Aug 8, 2002
- Douglas W. Babcock
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for driving circuit pins in a circuit testing...
- Publication number 20020093359
- Publication date Jul 18, 2002
- Douglas W. Babcock
- G01 - MEASURING TESTING

Douglas W. Babcock

Person

Patents Grantslast 30 patents

T-coil apparatus and method for compensating capacitance

Automatic test equipment pin channel with T-coil compensation

Apparatus and method for driving circuit pins in a circuit testing...

Circuit testing device using a driver to perform electronics testing

Parasitic capacitance cancellation circuit

Circuit and method of providing thermal compensation for a transist...

Automatic test equipment with active load having high-speed inhibit...

Patents Applicationslast 30 patents

T-coil apparatus and method for compensating capacitance

Automatic test equipment pin channel with T-coil compensation

Apparatus and method for driving circuit pins in a circuit testing...

Apparatus and method for driving circuit pins in a circuit testing...