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Douglas W. Smith
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Charlotte, UT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method of fabricating a connector
Patent number
7,155,818
Issue date
Jan 2, 2007
Douglas W. Smith
G01 - MEASURING TESTING
Information
Patent Grant
Interface apparatus for integrated circuit testing
Patent number
7,141,993
Issue date
Nov 28, 2006
inTEST Corporation
Douglas W. Smith
G01 - MEASURING TESTING
Information
Patent Grant
Electrically shielded connector
Patent number
6,997,762
Issue date
Feb 14, 2006
inTEST IP Corporation
Douglas W. Smith
G01 - MEASURING TESTING
Information
Patent Grant
Optical fiber interface for integrated circuit test system
Patent number
6,594,416
Issue date
Jul 15, 2003
inTest IP Corp.
Thornton W. Sargent
G01 - MEASURING TESTING
Information
Patent Grant
Optical fiber interface for integrated circuit test system
Patent number
6,404,949
Issue date
Jun 11, 2002
InTest IP Corporation
Thornton W. Sargent
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for coupling a test head and probe card in a wafer testin...
Patent number
6,259,260
Issue date
Jul 10, 2001
InTest IP Corporation
Douglas W. Smith
G01 - MEASURING TESTING
Information
Patent Grant
Optical fiber interface for integrated circuit test system
Patent number
6,249,621
Issue date
Jun 19, 2001
inTest Sunnyvale Corporation
Thornton W. Sargent
G01 - MEASURING TESTING
Information
Patent Grant
Control of temperature gradients during gel electrophoresis using t...
Patent number
5,736,025
Issue date
Apr 7, 1998
Genomyx Inc.
Douglas H. Smith
G01 - MEASURING TESTING
Information
Patent Grant
Transport apparatus
Patent number
5,483,843
Issue date
Jan 16, 1996
Thermo Separation Products Inc.
Leslie A. Miller
G01 - MEASURING TESTING
Information
Patent Grant
Rotary scanning apparatus
Patent number
5,483,075
Issue date
Jan 9, 1996
Perkin-Elmer Corporation
Douglas H. Smith
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Electrically shielded connector
Publication number
20050039331
Publication date
Feb 24, 2005
Douglas W. Smith
G01 - MEASURING TESTING
Information
Patent Application
Interface apparatus for integrated circuit testing
Publication number
20040150490
Publication date
Aug 5, 2004
Douglas W. Smith
G01 - MEASURING TESTING
Information
Patent Application
Electrically shielded connector
Publication number
20040023556
Publication date
Feb 5, 2004
Douglas W. Smith
G01 - MEASURING TESTING
Information
Patent Application
Interface apparatus for integrated circuit testing
Publication number
20030011390
Publication date
Jan 16, 2003
Douglas W. Smith
G01 - MEASURING TESTING
Information
Patent Application
Optical fiber interface for integrated circuit test system
Publication number
20020054731
Publication date
May 9, 2002
TestDesign Corp., a California Corporation
Thornton W. Sargent
G01 - MEASURING TESTING