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Douglas William Ormond Jr.
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Ossining, NY, US
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last 30 patents
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Patent Grant
Ion milling end point detection method and apparatus
Patent number
5,690,784
Issue date
Nov 25, 1997
International Business Machines Corporation
William Harrington Brearley
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Thin film metallization process for improved metal to substrate adh...
Patent number
5,631,498
Issue date
May 20, 1997
International Business Machines Corporation
Morris Anschel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for producing a plurality of layers of metallurgy
Patent number
4,805,683
Issue date
Feb 21, 1989
International Business Machines Corporation
Ingrid E. Magdo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing semiconductor devices in which oxide region...
Patent number
4,098,618
Issue date
Jul 4, 1978
International Business Machines Corporation
Billy Lee Crowder
H01 - BASIC ELECTRIC ELEMENTS