Douglas Y. Kim

Follow

Person

Poughkeepsie, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Facet tracking correction system for laser scanners
- Patent number 5,760,943
- Issue date Jun 2, 1998
- International Business Machines Corporation
- Douglas Yongshik Kim
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Automatic threshold level structure for calibrating an inspection tool
- Patent number 5,416,512
- Issue date May 16, 1995
- International Business Machines Corporation
- Douglas Y. Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for object inspection
- Patent number 5,220,617
- Issue date Jun 15, 1993
- International Business Machines Corporation
- Kenneth A. Bird
- G01 - MEASURING TESTING
Information Patent Grant
Advanced via inspection tool (AVIT)
- Patent number 5,216,485
- Issue date Jun 1, 1993
- International Business Machines Corporation
- Kenneth A. Bird
- G01 - MEASURING TESTING