Dov Furman

Person

Rehovot, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems of holographic interferometry
- Patent number 11,892,292
- Issue date Feb 6, 2024
- RD Synergy Ltd.
- Dov Furman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and systems of holographic interferometry
- Patent number 11,719,531
- Issue date Aug 8, 2023
- RD Synergy Ltd.
- Dov Furman
- G02 - OPTICS
Information Patent Grant
Methods and systems of holographic interferometry
- Patent number 10,725,428
- Issue date Jul 28, 2020
- RD Synergy Ltd.
- Dov Furman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Non-traversing tube inspection system
- Patent number 9,958,417
- Issue date May 1, 2018
- ARISE GLOBAL PTE. LTD
- Noam Amir
- G01 - MEASURING TESTING
Information Patent Grant
Handheld probe for tube inspection using APR
- Patent number 8,960,007
- Issue date Feb 24, 2015
- Acoustic Eye, Ltd
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of wafer defects
- Patent number 7,961,763
- Issue date Jun 14, 2011
- Applied Materials South East Asia Pte. Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of wafer defects
- Patent number 7,843,559
- Issue date Nov 30, 2010
- Applied Materials South East Asia Pte. Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection tools featuring light shaping diffusers
- Patent number 7,843,558
- Issue date Nov 30, 2010
- Applied Materials South East Asia Pte. Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Inspection tools supporting multiple operating states for multiple...
- Patent number 7,826,049
- Issue date Nov 2, 2010
- Applied Materials South East Asia Pte. Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting defects in wafers including alig...
- Patent number 7,804,993
- Issue date Sep 28, 2010
- Applied Materials South East Asia Pte. Ltd.
- Yuval Dorphan
- G01 - MEASURING TESTING
Information Patent Grant
Multi mode inspection method and apparatus
- Patent number 7,804,590
- Issue date Sep 28, 2010
- Applied Materials South East Asia Pte. Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Image splitting in optical inspection systems
- Patent number 7,719,674
- Issue date May 18, 2010
- Applied Materials South East Asia Pte. Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Image splitting in optical inspection systems
- Patent number 7,714,998
- Issue date May 11, 2010
- Applied Materials South East Asia Pte. Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection using short-pulsed continuous broadband illumination
- Patent number 7,659,973
- Issue date Feb 9, 2010
- Applied Materials Southeast Asia, Pte Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for determining optimum position of focus of an imaging s...
- Patent number 7,633,041
- Issue date Dec 15, 2009
- Applied Materials South East Asia Pte, Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of water defects
- Patent number 7,525,659
- Issue date Apr 28, 2009
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Fiber optical illumination system
- Patent number 7,486,861
- Issue date Feb 3, 2009
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Multi mode inspection method and apparatus
- Patent number 7,480,039
- Issue date Jan 20, 2009
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of wafer defects
- Patent number 7,477,383
- Issue date Jan 13, 2009
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Multi mode inspection method and apparatus
- Patent number 7,274,444
- Issue date Sep 25, 2007
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Fiber optical illumination system
- Patent number 7,260,298
- Issue date Aug 21, 2007
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Fiber optical illumination system
- Patent number 6,892,013
- Issue date May 10, 2005
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS OF HOLOGRAPHIC INTERFEROMETRY
- Publication number 20220018649
- Publication date Jan 20, 2022
- RD Synergy Ltd.
- Dov FURMAN
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS OF HOLOGRAPHIC INTERFEROMETRY
- Publication number 20200141715
- Publication date May 7, 2020
- RD Synergy Ltd.
- Dov FURMAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS AND SYSTEMS OF HOLOGRAPHIC INTERFEROMETRY
- Publication number 20180348703
- Publication date Dec 6, 2018
- RD Synergy Ltd.
- Dov FURMAN
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTABLE WIDE BANDWIDTH GUIDEDWAVE (GW) PROBE FOR TUBE AND PIPE I...
- Publication number 20170010179
- Publication date Jan 12, 2017
- Eyal Conforti
- G01 - MEASURING TESTING
Information Patent Application
WIDE BANDWIDTH GW PROBE FOR TUBE AND PIPE INSPECTION SYSTEM
- Publication number 20150253238
- Publication date Sep 10, 2015
- ACOUSTICEYE LTD
- Dov Furman
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Application
NON-TRAVERSING TUBE INSPECTION SYSTEM
- Publication number 20150122030
- Publication date May 7, 2015
- ACOUSTICEYE LTD
- Noam Amir
- G01 - MEASURING TESTING
Information Patent Application
HANDHELD PROBE FOR TUBE INSPECTION USING APR
- Publication number 20120227501
- Publication date Sep 13, 2012
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Optical Inspection Tools Featuring Light Shaping Diffusers
- Publication number 20090323053
- Publication date Dec 31, 2009
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION USING SHORT-PULSED CONTINUOUS BROADBAND ILLUMINATION
- Publication number 20090225307
- Publication date Sep 10, 2009
- NEGEVTECH, LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Inspection Tools Supporting Multiple Operating States for Multiple...
- Publication number 20090201494
- Publication date Aug 13, 2009
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Multi mode inspection method and apparatus
- Publication number 20090091749
- Publication date Apr 9, 2009
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Image Splitting in Optical Inspection Systems
- Publication number 20080137073
- Publication date Jun 12, 2008
- NEGEVTECH, LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Image Splitting in Optical Inspection Systems
- Publication number 20080137074
- Publication date Jun 12, 2008
- NEGEVTECH, LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Speckle reduction using a fiber bundle and light guide
- Publication number 20080037933
- Publication date Feb 14, 2008
- Negevtech, Ltd.
- Dov Furman
- G02 - OPTICS
Information Patent Application
Multi mode inspection method and apparatus
- Publication number 20070291256
- Publication date Dec 20, 2007
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Wafer Inspection Using Short-Pulsed Continuous Broadband Illumination
- Publication number 20070273945
- Publication date Nov 29, 2007
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Fiber optical illumination system
- Publication number 20070146694
- Publication date Jun 28, 2007
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20070019856
- Publication date Jan 25, 2007
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20070013903
- Publication date Jan 18, 2007
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20060244956
- Publication date Nov 2, 2006
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20060244958
- Publication date Nov 2, 2006
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20060244957
- Publication date Nov 2, 2006
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for detecting defects in wafers including alig...
- Publication number 20060193506
- Publication date Aug 31, 2006
- Negevtech Ltd.
- Yuval Dorphan
- G01 - MEASURING TESTING
Information Patent Application
Multi mode inspection method and apparatus
- Publication number 20060007434
- Publication date Jan 12, 2006
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Fiber optical illumination system
- Publication number 20050180707
- Publication date Aug 18, 2005
- NEGEVTECH LTD.
- Dov Furman
- G02 - OPTICS
Information Patent Application
System for detection of wafer defects
- Publication number 20050110987
- Publication date May 26, 2005
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20040146295
- Publication date Jul 29, 2004
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Fiber optical illumination system
- Publication number 20040136665
- Publication date Jul 15, 2004
- NEGEVTECH LTD.
- Dov Furman
- G02 - OPTICS

Person

Patents Grantslast 30 patents

Methods and systems of holographic interferometry

Methods and systems of holographic interferometry

Methods and systems of holographic interferometry

Non-traversing tube inspection system

Handheld probe for tube inspection using APR

System for detection of wafer defects

System for detection of wafer defects

Optical inspection tools featuring light shaping diffusers

Inspection tools supporting multiple operating states for multiple...

Method and apparatus for detecting defects in wafers including alig...

Multi mode inspection method and apparatus

Image splitting in optical inspection systems

Image splitting in optical inspection systems

Wafer inspection using short-pulsed continuous broadband illumination

Apparatus for determining optimum position of focus of an imaging s...

System for detection of water defects

Fiber optical illumination system

Multi mode inspection method and apparatus

System for detection of wafer defects

Multi mode inspection method and apparatus

Fiber optical illumination system

Fiber optical illumination system

Patents Applicationslast 30 patents

METHODS AND SYSTEMS OF HOLOGRAPHIC INTERFEROMETRY

METHODS AND SYSTEMS OF HOLOGRAPHIC INTERFEROMETRY

METHODS AND SYSTEMS OF HOLOGRAPHIC INTERFEROMETRY

ADJUSTABLE WIDE BANDWIDTH GUIDEDWAVE (GW) PROBE FOR TUBE AND PIPE I...

WIDE BANDWIDTH GW PROBE FOR TUBE AND PIPE INSPECTION SYSTEM

NON-TRAVERSING TUBE INSPECTION SYSTEM

HANDHELD PROBE FOR TUBE INSPECTION USING APR

Optical Inspection Tools Featuring Light Shaping Diffusers

WAFER INSPECTION USING SHORT-PULSED CONTINUOUS BROADBAND ILLUMINATION

Inspection Tools Supporting Multiple Operating States for Multiple...

Multi mode inspection method and apparatus

Image Splitting in Optical Inspection Systems

Image Splitting in Optical Inspection Systems

Speckle reduction using a fiber bundle and light guide

Multi mode inspection method and apparatus

Wafer Inspection Using Short-Pulsed Continuous Broadband Illumination

Fiber optical illumination system

System for detection of wafer defects

System for detection of wafer defects

System for detection of wafer defects

System for detection of wafer defects

System for detection of wafer defects

Method and apparatus for detecting defects in wafers including alig...

Multi mode inspection method and apparatus

Fiber optical illumination system

System for detection of wafer defects

System for detection of wafer defects

Fiber optical illumination system