Dov Shachal

Person

Rehovot, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope
- Patent number 9,466,458
- Issue date Oct 11, 2016
- B-NANO LTD.
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope, an interface and a method for observi...
- Patent number 9,431,213
- Issue date Aug 30, 2016
- B-Nano Ltd.
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interface, a method for observing an object within a non-vacuum env...
- Patent number 9,287,089
- Issue date Mar 15, 2016
- B-NANO LTD.
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interface, a method for observing an object within a non-vacuum env...
- Patent number 9,076,631
- Issue date Jul 7, 2015
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope, an interface and a method for observi...
- Patent number 8,981,294
- Issue date Mar 17, 2015
- B-Nano Ltd.
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interface, a method for observing an object within a non-vacuum env...
- Patent number 8,779,358
- Issue date Jul 15, 2014
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuumed device and a scanning electron microscope
- Patent number 8,492,716
- Issue date Jul 23, 2013
- B-Nano Ltd.
- Dov Shachal
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Scanning electron microscope, an interface and a method for observi...
- Patent number 8,334,510
- Issue date Dec 18, 2012
- B-Nano Ltd.
- Dov Shachal
- G01 - MEASURING TESTING
Information Patent Grant
Interface, a method for observing an object within a non-vacuum env...
- Patent number 8,164,057
- Issue date Apr 24, 2012
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Secondary electron spectroscopy method and system
- Patent number 6,627,886
- Issue date Sep 30, 2003
- Applied Materials, Inc.
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...
- Publication number 20160155606
- Publication date Jun 2, 2016
- B-NANO LTD.
- Dov SHACHAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20150380207
- Publication date Dec 31, 2015
- B-NANO LTD.
- Dov SHACHAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...
- Publication number 20150243475
- Publication date Aug 27, 2015
- B-NANO LTD.
- Dov SHACHAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...
- Publication number 20150235806
- Publication date Aug 20, 2015
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...
- Publication number 20140361166
- Publication date Dec 11, 2014
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...
- Publication number 20140117232
- Publication date May 1, 2014
- B-NANO LTD.
- Dov SHACHAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...
- Publication number 20120241608
- Publication date Sep 27, 2012
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VACUUMED DEVICE AND A SCANNING ELECTRON MICROSCOPE
- Publication number 20110210247
- Publication date Sep 1, 2011
- B-NANO LTD.
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...
- Publication number 20110168889
- Publication date Jul 14, 2011
- Dov Shachal
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...
- Publication number 20100140470
- Publication date Jun 10, 2010
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS

Dov Shachal

Person

Patents Grantslast 30 patents

Scanning electron microscope

Scanning electron microscope, an interface and a method for observi...

Interface, a method for observing an object within a non-vacuum env...

Interface, a method for observing an object within a non-vacuum env...

Scanning electron microscope, an interface and a method for observi...

Interface, a method for observing an object within a non-vacuum env...

Vacuumed device and a scanning electron microscope

Scanning electron microscope, an interface and a method for observi...

Interface, a method for observing an object within a non-vacuum env...

Secondary electron spectroscopy method and system

Patents Applicationslast 30 patents

INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...

SCANNING ELECTRON MICROSCOPE

SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...

INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...

INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...

SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...

INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...

VACUUMED DEVICE AND A SCANNING ELECTRON MICROSCOPE

SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...

INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...