Doyoung Yoon

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Seoul, KR

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Patents Grantslast 30 patents

Information Patent Grant
Inspection system of semiconductor wafer and method of driving the...
- Patent number 12,130,242
- Issue date Oct 29, 2024
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection system of semiconductor wafer and method of driving the...
- Patent number 11,754,510
- Issue date Sep 12, 2023
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE...
- Publication number 20230384239
- Publication date Nov 30, 2023
- Samsung Electronics Co., Ltd.
- Doyoung YOON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE...
- Publication number 20230123710
- Publication date Apr 20, 2023
- Samsung Electronics Co., Ltd.
- Doyoung YOON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE INSPECTION METHOD AND DEVICE
- Publication number 20230033089
- Publication date Feb 2, 2023
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ROTATION ANGLE MEASUREMENT MARKS AND METHODS OF MEASURING ROTATION...
- Publication number 20170146340
- Publication date May 25, 2017
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- G01 - MEASURING TESTING