Dror Alumot

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Tel Aviv, IL

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Patents Grantslast 30 patents

Information Patent Grant
Examination of a semiconductor specimen
- Patent number 11,022,566
- Issue date Jun 1, 2021
- Applied Materials Israel Ltd.
- Dror Alumot
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGE DENOISING FOR EXAMINATION OF A SEMICONDUCTOR SPECIMEN
- Publication number 20240153043
- Publication date May 9, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Tamir EINY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OVERLAY MEASUREMENT FOR A SEMICONDUCTOR SPECIMEN
- Publication number 20240062355
- Publication date Feb 22, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Dror ALUMOT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHAPE LOCALIZATION FOR EXAMINING A SEMICONDUCTOR SPECIMEN
- Publication number 20240046445
- Publication date Feb 8, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Gilad VERED
- G06 - COMPUTING CALCULATING COUNTING