Dror SHAFIR

Person

Kiryat Ono, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Optical phase measurement system and method
- Patent number 11,946,875
- Issue date Apr 2, 2024
- Nova Ltd.
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for optical characterization of patterned samples
- Patent number 11,885,737
- Issue date Jan 30, 2024
- Nova Ltd.
- Dror Shafir
- G01 - MEASURING TESTING
Information Patent Grant
Optical phase measurement system and method
- Patent number 11,460,415
- Issue date Oct 4, 2022
- Nova Ltd.
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Time-domain optical metrology and inspection of semiconductor devices
- Patent number 11,366,398
- Issue date Jun 21, 2022
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Optical phase measurement method and system
- Patent number 11,029,258
- Issue date Jun 8, 2021
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for optical characterization of patterned samples
- Patent number 10,876,959
- Issue date Dec 29, 2020
- Nova Measuring Instruments Ltd.
- Dror Shafir
- G01 - MEASURING TESTING
Information Patent Grant
Optical system and method for measurements of samples
- Patent number 10,739,277
- Issue date Aug 11, 2020
- Nova Measuring Instruments Ltd.
- Yoav Berlatzky
- G01 - MEASURING TESTING
Information Patent Grant
Optical phase measurement system and method
- Patent number 10,663,408
- Issue date May 26, 2020
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical critical dimension metrology
- Patent number 10,365,163
- Issue date Jul 30, 2019
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Optical phase measurement method and system
- Patent number 10,365,231
- Issue date Jul 30, 2019
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Overlay design optimization
- Patent number 10,311,198
- Issue date Jun 4, 2019
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical phase measurement method and system
- Patent number 10,161,885
- Issue date Dec 25, 2018
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Optical method and system for measuring isolated features of a stru...
- Patent number 10,073,045
- Issue date Sep 11, 2018
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Optical method and system for critical dimensions and thickness cha...
- Patent number 10,054,423
- Issue date Aug 21, 2018
- Nova Measuring Instruments Ltd.
- Dror Shafir
- G02 - OPTICS
Information Patent Grant
Optical critical dimension metrology
- Patent number 10,041,838
- Issue date Aug 7, 2018
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Optical phase measurement method and system
- Patent number 9,897,553
- Issue date Feb 20, 2018
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20240361253
- Publication date Oct 31, 2024
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
- Publication number 20240337590
- Publication date Oct 10, 2024
- NOVA LTD
- Dror SHAFIR
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY TECHNIQUE FOR SEMICONDUCTOR DEVICES
- Publication number 20240271926
- Publication date Aug 15, 2024
- NOVA LTD
- Dror SHAFIR
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT SYSTEM AND METHOD
- Publication number 20230130231
- Publication date Apr 27, 2023
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES
- Publication number 20220390858
- Publication date Dec 8, 2022
- NOVA LTD
- GILAD BARAK
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20210364451
- Publication date Nov 25, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES
- Publication number 20210247699
- Publication date Aug 12, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- GILAD BARAK
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
- Publication number 20210116359
- Publication date Apr 22, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- Dror SHAFIR
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT SYSTEM AND METHOD
- Publication number 20200355622
- Publication date Nov 12, 2020
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT SYSTEM AND METHOD
- Publication number 20200025693
- Publication date Jan 23, 2020
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20190154594
- Publication date May 23, 2019
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM AND METHOD FOR MEASUREMENTS OF SAMPLES
- Publication number 20190128823
- Publication date May 2, 2019
- NOVA MEASURING INSTRUMENTS LTD.
- Yoav BERLATZKY
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CRITICAL DIMENSION METROLOGY
- Publication number 20190063999
- Publication date Feb 28, 2019
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
- Publication number 20180328837
- Publication date Nov 15, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- Dror SHAFIR
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20180128753
- Publication date May 10, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
OVERLAY DESIGN OPTIMIZATION
- Publication number 20170061066
- Publication date Mar 2, 2017
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20170016835
- Publication date Jan 19, 2017
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CRITICAL DIMENSION METROLOGY
- Publication number 20160363484
- Publication date Dec 15, 2016
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20150377799
- Publication date Dec 31, 2015
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METHOD AND SYSTEM FOR CRITICAL DIMENSIONS AND THICKNESS CHA...
- Publication number 20150345934
- Publication date Dec 3, 2015
- NOVA MEASURING INSTRUMENTS LTD.
- Dror SHAFIR
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
- Publication number 20150316468
- Publication date Nov 5, 2015
- NOVA MEASURING INSTRUMENTS LTD.
- Dror SHAFIR
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METHOD AND SYSTEM FOR MEASURING ISOLATED FEATURES OF A STRU...
- Publication number 20150212012
- Publication date Jul 30, 2015
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad Barak
- G01 - MEASURING TESTING

Dror SHAFIR

Person

Patents Grantslast 30 patents

Optical phase measurement system and method

Method and system for optical characterization of patterned samples

Optical phase measurement system and method

Time-domain optical metrology and inspection of semiconductor devices

Optical phase measurement method and system

Method and system for optical characterization of patterned samples

Optical system and method for measurements of samples

Optical phase measurement system and method

Optical critical dimension metrology

Optical phase measurement method and system

Overlay design optimization

Optical phase measurement method and system

Optical method and system for measuring isolated features of a stru...

Optical method and system for critical dimensions and thickness cha...

Optical critical dimension metrology

Optical phase measurement method and system

Patents Applicationslast 30 patents

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES

METROLOGY TECHNIQUE FOR SEMICONDUCTOR DEVICES

OPTICAL PHASE MEASUREMENT SYSTEM AND METHOD

TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES

METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES

OPTICAL PHASE MEASUREMENT SYSTEM AND METHOD

OPTICAL PHASE MEASUREMENT SYSTEM AND METHOD

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

OPTICAL SYSTEM AND METHOD FOR MEASUREMENTS OF SAMPLES

OPTICAL CRITICAL DIMENSION METROLOGY

METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

OVERLAY DESIGN OPTIMIZATION

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

OPTICAL CRITICAL DIMENSION METROLOGY

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

OPTICAL METHOD AND SYSTEM FOR CRITICAL DIMENSIONS AND THICKNESS CHA...

METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES

OPTICAL METHOD AND SYSTEM FOR MEASURING ISOLATED FEATURES OF A STRU...