Duane C. Holmes

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Sample support with a non-reflecting sample supporting surface
- Patent number 6,108,077
- Issue date Aug 22, 2000
- Nanometrics Incorporated
- John D. Heaton
- G01 - MEASURING TESTING
Information Patent Grant
Integrated optical measurement instruments
- Patent number 5,943,122
- Issue date Aug 24, 1999
- Nanometrics Incorporated
- Duane C. Holmes
- G02 - OPTICS
Information Patent Grant
Microscope stage assembly and control system
- Patent number 4,627,009
- Issue date Dec 2, 1986
- Nanometrics Inc.
- Duane C. Holmes
- G05 - CONTROLLING REGULATING
Information Patent Grant
Three-stage secondary emission electron detection in electron micro...
- Patent number 4,596,929
- Issue date Jun 24, 1986
- Nanometrics Incorporated
- Vincent J. Coates
- H01 - BASIC ELECTRIC ELEMENTS