Duane D. Wendling

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Kutztown, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
In-situ automated contactless thickness measurement for wafer thinning
- Patent number 6,437,868
- Issue date Aug 20, 2002
- Agere Systems Guardian Corp.
- David Gerald Coult
- B24 - GRINDING POLISHING
Information Patent Grant
Fixture with at least one trough and method of using the fixture in...
- Patent number 6,210,546
- Issue date Apr 3, 2001
- Lucent Technologies Inc.
- David G. Coult
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES