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Duane E. Meyer
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Lincoln, NE, US
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Patents Grants
last 30 patents
Information
Patent Grant
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
Patent number
11,675,208
Issue date
Jun 13, 2023
J. A. Woollam Co., Inc.
Stefan Schoeche
G01 - MEASURING TESTING
Information
Patent Grant
Beam focusing and reflecting optics with enhanced detector system
Patent number
10,338,362
Issue date
Jul 2, 2019
J. A. Woollam Co., Inc.
Martin M. Liphardt
G02 - OPTICS
Information
Patent Grant
Enhanced detector operation made possible by application of a funct...
Patent number
10,247,611
Issue date
Apr 2, 2019
J.A. Wooliam Co., Inc.
Martin M. Liphardt
G01 - MEASURING TESTING
Information
Patent Grant
Mounting for deviation angle self compensating substantially achrom...
Patent number
8,462,341
Issue date
Jun 11, 2013
J. A. Woollam Co., Inc.
Ping He
G01 - MEASURING TESTING
Information
Patent Grant
Method of constructing a deviation angle self compensating substant...
Patent number
7,907,280
Issue date
Mar 15, 2011
J. A. Woollam Co., Inc.
Blaine D. Johs
G01 - MEASURING TESTING
Information
Patent Grant
Deviation angle self compensating substantially achromatic retarder
Patent number
7,460,230
Issue date
Dec 2, 2008
J. A. Woollam Co., Inc.
Blaine D. Johs
G02 - OPTICS
Information
Patent Grant
Deviation angle self compensating substantially achromatic retarder
Patent number
7,450,231
Issue date
Nov 11, 2008
J. A. Woollam Co., Inc.
Blaine D. Johs
G01 - MEASURING TESTING
Information
Patent Grant
Control of beam spot size in ellipsometer and the like systems
Patent number
7,345,762
Issue date
Mar 18, 2008
J. A. Woollam Co., Inc.
Martin M. Liphardt
G01 - MEASURING TESTING
Information
Patent Grant
Monochromator system and applications thereof
Patent number
6,982,789
Issue date
Jan 3, 2006
J. A. Woollam Co. Inc.
Duane E. Meyer
G01 - MEASURING TESTING
Information
Patent Grant
Bilateral slit assembly, and method of use
Patent number
5,661,589
Issue date
Aug 26, 1997
J. A. Woollam Co. Inc.
Duane E. Meyer
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
Publication number
20220244169
Publication date
Aug 4, 2022
J. A. WOOLLAM CO., INC.
Ping He
G02 - OPTICS
Information
Patent Application
Mounting for deviation angle self compensating substantially achrom...
Publication number
20110188040
Publication date
Aug 4, 2011
Ping He
G01 - MEASURING TESTING
Information
Patent Application
Method of constructing a deviation angle self compensating substant...
Publication number
20090091758
Publication date
Apr 9, 2009
Blaine D. Johs
G02 - OPTICS
Information
Patent Application
Deviation angle self compensating substantially achromatic retarder
Publication number
20080100842
Publication date
May 1, 2008
Blaine D. Johs
G02 - OPTICS
Information
Patent Application
Deviation angle self compensating substantially achromatic retarder
Publication number
20070253059
Publication date
Nov 1, 2007
Blaine D. Johs
G02 - OPTICS