Duck Mahn Oh

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Suwon-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Methods for nondestructive measurements of thickness of underlying...
- Patent number 10,989,520
- Issue date Apr 27, 2021
- Samsung Electronics Co., Ltd.
- Duck-mahn Oh
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe inspector
- Patent number 10,585,115
- Issue date Mar 10, 2020
- Samsung Electronics Co., Ltd.
- Duck Mahn Oh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS FOR NONDESTRUCTIVE MEASUREMENTS OF THICKNESS OF UNDERLYING...
- Publication number 20200208964
- Publication date Jul 2, 2020
- Samsung Electronics Co., Ltd.
- Duck-mahn OH
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE INSPECTOR
- Publication number 20190170788
- Publication date Jun 6, 2019
- Samsung Electronics Co., Ltd.
- Duck Mahn Oh
- G02 - OPTICS