Duck-Sun Yang

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Seoul, KR

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for detecting particles on an object
- Patent number 7,245,365
- Issue date Jul 17, 2007
- Samsung Electronics Co., Ltd.
- Deok-Yong Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and system for measuring overlay of semiconductor device
- Publication number 20070064232
- Publication date Mar 22, 2007
- SAMSUNG ELECTRONICS CO., LTD.
- Duck-Sun Yang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Specimen inspection apparatus and reference value setting unit and...
- Publication number 20050111004
- Publication date May 26, 2005
- Byoung-Chul Kim
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting particles on an object
- Publication number 20040201841
- Publication date Oct 14, 2004
- Deok-Yong Kim
- G01 - MEASURING TESTING