Dug Young KIM

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Gwangju, KR

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for measuring fluorescence lifetime
- Patent number 8,314,405
- Issue date Nov 20, 2012
- Gwangju Institute of Science and Technology
- Dug Young Kim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring residual stress of optical fiber
- Patent number 8,098,371
- Issue date Jan 17, 2012
- Gwangju Institute of Science and Technology
- Dug Young Kim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for obtaining images using coherent anti-stoke...
- Patent number 8,064,064
- Issue date Nov 22, 2011
- Gwangju Institute of Science and Technology
- Dug Young Kim
- G01 - MEASURING TESTING
Information Patent Grant
Optical phase microscope using rotating 1/4 wavelength plate with p...
- Patent number 7,679,038
- Issue date Mar 16, 2010
- Gwangju Institute of Science and Technology
- Dug Young Kim
- G02 - OPTICS
Information Patent Grant
Apparatus for measuring differential mode delay of multimode optica...
- Patent number 7,369,249
- Issue date May 6, 2008
- Gwangju Institute of Science and Technology
- Dug Young Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR OBTAINING IMAGES USING COHERENT ANTI-STOKE...
- Publication number 20090213370
- Publication date Aug 27, 2009
- Gwangju Institute of Science and Technology
- Dug Young KIM
- G01 - MEASURING TESTING
Information Patent Application
POLARISCOPIC PHASE MICROSCOPE
- Publication number 20090184240
- Publication date Jul 23, 2009
- Gwangju Institute of Science and Technology
- Dug Young KIM
- G02 - OPTICS
Information Patent Application
APPARATUS FOR MEASURING RESIDUAL STRESS OF OPTICAL FIBER
- Publication number 20090180103
- Publication date Jul 16, 2009
- Gwangju Institute of Science and Technology
- Dug Young KIM
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MEASURING FLUORESCENCE LIFETIME
- Publication number 20090095911
- Publication date Apr 16, 2009
- Gwangju Institute of Science and Technology
- Dug Young KIM
- G01 - MEASURING TESTING