Durbin L. Seidel

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Fort Collins, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for testing integrated circuit devices
- Patent number 6,392,423
- Issue date May 21, 2002
- Agilent Technologies, Inc.
- Bradley D. Pace
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing integrated circuit devices
- Patent number 6,285,200
- Issue date Sep 4, 2001
- Agilent Technologies, Inc.
- Bradley D. Pace
- G01 - MEASURING TESTING
Information Patent Grant
CMOS power fet driver including multiple power MOSFET transistors c...
- Patent number 5,442,218
- Issue date Aug 15, 1995
- AT&T Global Information Solutions Company
- Durbin L. Seidel
- G11 - INFORMATION STORAGE
Information Patent Grant
Sample-and-hold switch with low on resistance and reduced charge in...
- Patent number 5,111,072
- Issue date May 5, 1992
- NCR Corporation
- Durbin L. Seidel
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Method for testing integrated circuit devices
- Publication number 20010019275
- Publication date Sep 6, 2001
- Bradley D. Pace
- G01 - MEASURING TESTING