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Dwight A. SEHLER
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Longmont, CO, US
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Patents Grants
last 30 patents
Information
Patent Grant
Two-dimensional optical imaging methods and systems for particle de...
Patent number
8,427,642
Issue date
Apr 23, 2013
Particle Measuring Systems, Inc.
John Mitchell
G01 - MEASURING TESTING
Information
Patent Grant
Non-orthogonal particle detection systems and methods
Patent number
8,174,697
Issue date
May 8, 2012
Particle Measuring Systems, Inc.
John Mitchell
G01 - MEASURING TESTING
Information
Patent Grant
Two-dimensional optical imaging methods and systems for particle de...
Patent number
8,154,724
Issue date
Apr 10, 2012
Particle Measuring Systems, Inc.
John Mitchell
G01 - MEASURING TESTING
Information
Patent Grant
Non-orthogonal particle detection systems and methods
Patent number
8,027,035
Issue date
Sep 27, 2011
Particle Measuring Systems, Inc.
John Mitchell
G01 - MEASURING TESTING
Information
Patent Grant
Non-orthogonal particle detection systems and methods
Patent number
7,916,293
Issue date
Mar 29, 2011
Particle Measuring Systems, Inc.
John Mitchell
G01 - MEASURING TESTING
Information
Patent Grant
Particle counter with improved image sensor array
Patent number
7,456,960
Issue date
Nov 25, 2008
Particle Measuring Systems, Inc.
Todd A. Cerni
G01 - MEASURING TESTING
Information
Patent Grant
Diode pumped intracavity laser particle counter with improved relia...
Patent number
7,030,980
Issue date
Apr 18, 2006
Particle Measuring Systems, Inc.
Dwight A. Sehler
G01 - MEASURING TESTING
Information
Patent Grant
Low noise intracavity laser particle counter
Patent number
6,903,818
Issue date
Jun 7, 2005
Particle Measuring Systems, Inc.
Todd A. Cerni
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ENHANCED DUAL-PASS AND MULTI-PASS PARTICLE DETECTION
Publication number
20230236107
Publication date
Jul 27, 2023
Particle Measuring Systems, Inc.
Mehran Vahdani MOGHADDAM
G01 - MEASURING TESTING
Information
Patent Application
Two-Dimensional Optical Imaging Methods and Systems for Particle De...
Publication number
20120140223
Publication date
Jun 7, 2012
Particle Measuring Systems, Inc.
John MITCHELL
G01 - MEASURING TESTING
Information
Patent Application
Non-Orthogonal Particle Detection Systems and Methods
Publication number
20120012757
Publication date
Jan 19, 2012
Particle Measuring Systems, Inc.
John MITCHELL
G01 - MEASURING TESTING
Information
Patent Application
Non-Orthogonal Particle Detection Systems and Methods
Publication number
20110155927
Publication date
Jun 30, 2011
Particle Measuring Systems, Inc.
John MITCHELL
G01 - MEASURING TESTING
Information
Patent Application
TWO-DIMENSIONAL OPTICAL IMAGING METHODS AND SYSTEMS FOR PARTICLE DE...
Publication number
20090244536
Publication date
Oct 1, 2009
John Mitchell
G01 - MEASURING TESTING
Information
Patent Application
NON-ORTHOGONAL PARTICLE DETECTION SYSTEMS AND METHODS
Publication number
20090219530
Publication date
Sep 3, 2009
John Mitchell
G01 - MEASURING TESTING
Information
Patent Application
Particle Counter With Improved Image Sensor Array
Publication number
20090190128
Publication date
Jul 30, 2009
Particle Measuring Systems, Inc.
Todd A. CERNI
G01 - MEASURING TESTING
Information
Patent Application
Particle counter with improved image sensor array
Publication number
20060274309
Publication date
Dec 7, 2006
Particle Measuring Systems Inc
Todd A. Cerni
G01 - MEASURING TESTING
Information
Patent Application
Low noise intracavity laser particle counter
Publication number
20040080747
Publication date
Apr 29, 2004
Particle Measuring Systems, Inc.
Todd A. Cerni
G01 - MEASURING TESTING