Dwight Jaynes

Follow

Person

Richardson, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multipurpose test chip input/output circuit
- Patent number 6,535,049
- Issue date Mar 18, 2003
- Hewlett-Packard Company
- Dwight Jaynes
- G01 - MEASURING TESTING
Information Patent Grant
Multipurpose test chip input/output circuit
- Patent number 6,407,613
- Issue date Jun 18, 2002
- Hewlett-Packard Company
- Dwight Jaynes
- G01 - MEASURING TESTING
Information Patent Grant
Test chip circuit for on-chip timing characterization
- Patent number 5,787,092
- Issue date Jul 28, 1998
- Hewlett-Packard Co.
- Dwight Jaynes
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Multipurpose test chip input/output circuit
- Publication number 20020030531
- Publication date Mar 14, 2002
- Dwight Jaynes
- G01 - MEASURING TESTING