Dwight K. Elvey

Person

Santa Cruz, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for providing clock signals for a scan chain
- Patent number 10,310,015
- Issue date Jun 4, 2019
- Advanced Micro Devices, Inc.
- Thomas A. Clouqueur
- G01 - MEASURING TESTING
Information Patent Grant
Preventing A-B-A race in a latch-based device
- Patent number 9,000,806
- Issue date Apr 7, 2015
- Advanced Micro Devices, Inc.
- Dwight K. Elvey
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Fault tolerant scannable glitch latch
- Patent number 8,850,278
- Issue date Sep 30, 2014
- Advanced Micro Devices, Inc.
- Kevin M. Gillespie
- G01 - MEASURING TESTING
Information Patent Grant
Preventing A-B-A race in a latch-based device
- Patent number 8,461,874
- Issue date Jun 11, 2013
- Advanced Micro Devices, Inc.
- Dwight K. Elvey
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Test techniques for a delay-locked loop receiver interface
- Patent number 7,817,761
- Issue date Oct 19, 2010
- Advanced Micro Devices, Inc.
- Meei-Ling Chiang
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous core testing in multi-core integrated circuits
- Patent number 7,685,487
- Issue date Mar 23, 2010
- Advanced Micro Devices, Inc.
- Ting-Yu Kuo
- G01 - MEASURING TESTING
Information Patent Grant
System and method for improving LBIST test coverage
- Patent number 6,636,997
- Issue date Oct 21, 2003
- Fujitsu Limited
- Paul Wong
- G01 - MEASURING TESTING
Information Patent Grant
Test fixture for providing electrical access to each I/O pin of a V...
- Patent number 4,504,783
- Issue date Mar 12, 1985
- Storage Technology Partners
- John Zasio
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR PROVIDING CLOCK SIGNALS FOR A SCAN CHAIN
- Publication number 20150026532
- Publication date Jan 22, 2015
- Advanced Micro Devices, Inc.
- Thomas A. Clouqueur
- G01 - MEASURING TESTING
Information Patent Application
PREVENTING A-B-A RACE IN A LATCH-BASED DEVICE
- Publication number 20130257479
- Publication date Oct 3, 2013
- Dwight K. ELVEY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PREVENTING A-B-A RACE IN A LATCH-BASED DEVICE
- Publication number 20130021064
- Publication date Jan 24, 2013
- Advanced Micro Devices, Inc.
- Dwight K. Elvey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAULT TOLERANT SCANNABLE GLITCH LATCH
- Publication number 20120166899
- Publication date Jun 28, 2012
- Advanced Micro Devices, Inc.
- Kevin M. Gillespie
- G01 - MEASURING TESTING
Information Patent Application
TEST TECHNIQUES FOR A DELAY-LOCKED LOOP RECEIVER INTERFACE
- Publication number 20080297216
- Publication date Dec 4, 2008
- Meei-Ling Chiang
- H03 - BASIC ELECTRONIC CIRCUITRY

Dwight K. Elvey

Person

Patents Grantslast 30 patents

Method and apparatus for providing clock signals for a scan chain

Preventing A-B-A race in a latch-based device

Fault tolerant scannable glitch latch

Preventing A-B-A race in a latch-based device

Test techniques for a delay-locked loop receiver interface

Simultaneous core testing in multi-core integrated circuits

System and method for improving LBIST test coverage

Test fixture for providing electrical access to each I/O pin of a V...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR PROVIDING CLOCK SIGNALS FOR A SCAN CHAIN

PREVENTING A-B-A RACE IN A LATCH-BASED DEVICE

PREVENTING A-B-A RACE IN A LATCH-BASED DEVICE

FAULT TOLERANT SCANNABLE GLITCH LATCH

TEST TECHNIQUES FOR A DELAY-LOCKED LOOP RECEIVER INTERFACE