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Dwight SEHLER
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Boulder, CO, US
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Patents Grants
last 30 patents
Information
Patent Grant
Advanced systems and methods for interferometric particle detection...
Patent number
11,988,593
Issue date
May 21, 2024
Particle Measuring Systems, Inc.
Timothy A Ellis
G01 - MEASURING TESTING
Information
Patent Grant
Particle detection systems and methods for on-axis particle detecti...
Patent number
11,946,852
Issue date
Apr 2, 2024
Particle Measuring Systems, Inc.
Daniel Rodier
G01 - MEASURING TESTING
Information
Patent Grant
Particle detection systems and methods for on-axis particle detecti...
Patent number
11,237,095
Issue date
Feb 1, 2022
Particle Measuring Systems, Inc.
Daniel Rodier
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
ADVANCED SYSTEMS AND METHODS FOR INTERFEROMETRIC PARTICLE DETECTION...
Publication number
20240230509
Publication date
Jul 11, 2024
Particle Measuring Systems, Inc.
Timothy A. ELLIS
G01 - MEASURING TESTING
Information
Patent Application
ADVANCED SYSTEMS AND METHODS FOR INTERFEROMETRIC PARTICLE DETECTION...
Publication number
20240133793
Publication date
Apr 25, 2024
Particle Measuring Systems, Inc.
Timothy A. ELLIS
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ISOLATOR STABILIZED LASER OPTICAL PARTICLE DETECTOR SYSTEMS...
Publication number
20230087059
Publication date
Mar 23, 2023
Particle Measuring Systems, Inc.
Brian A. KNOLLENBERG
G02 - OPTICS
Information
Patent Application
PARTICLE DETECTION SYSTEMS AND METHODS FOR ON-AXIS PARTICLE DETECTI...
Publication number
20220155212
Publication date
May 19, 2022
Particle Measuring Systems, Inc.
Daniel RODIER
G01 - MEASURING TESTING
Information
Patent Application
ADVANCED SYSTEMS AND METHODS FOR INTERFEROMETRIC PARTICLE DETECTION...
Publication number
20210208054
Publication date
Jul 8, 2021
Particle Measuring Systems, Inc.
Timothy A. ELLIS
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE DETECTION SYSTEMS AND METHODS FOR ON-AXIS PARTICLE DETECTI...
Publication number
20200355599
Publication date
Nov 12, 2020
Particle Measuring Systems, Inc.
Daniel RODIER
G01 - MEASURING TESTING