Dzmitry S. Maliuk

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Addison, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Scan chain latch design that improves testability of integrated cir...
- Patent number 10,571,520
- Issue date Feb 25, 2020
- Internatioanl Business Machines Corporation
- Dzmitry S. Maliuk
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain latch design that improves testability of integrated cir...
- Patent number 9,678,152
- Issue date Jun 13, 2017
- International Business Machines Corporation
- Dzmitry S. Maliuk
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain latch design that improves testability of integrated cir...
- Patent number 9,372,231
- Issue date Jun 21, 2016
- International Business Machines Corporation
- Dzmitry S. Maliuk
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain latch design that improves testability of integrated cir...
- Patent number 9,261,561
- Issue date Feb 16, 2016
- International Business Machines Corporation
- Dzmitry S. Maliuk
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain latch design that improves testability of integrated cir...
- Patent number 9,086,457
- Issue date Jul 21, 2015
- International Business Machines Corporation
- Dzmitry Maliuk
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCAN CHAIN LATCH DESIGN THAT IMPROVES TESTABILITY OF INTEGRATED CIR...
- Publication number 20170242073
- Publication date Aug 24, 2017
- International Business Machines Corporation
- Dzmitry S. Maliuk
- G01 - MEASURING TESTING
Information Patent Application
SCAN CHAIN LATCH DESIGN THAT IMPROVES TESTABILITY OF INTEGRATED CIR...
- Publication number 20170097389
- Publication date Apr 6, 2017
- International Business Machines Corporation
- Dzmitry S. Maliuk
- G01 - MEASURING TESTING
Information Patent Application
SCAN CHAIN LATCH DESIGN THAT IMPROVES TESTABILITY OF INTEGRATED CIR...
- Publication number 20160116534
- Publication date Apr 28, 2016
- International Business Machines Corporation
- Dzmitry S. Maliuk
- G01 - MEASURING TESTING
Information Patent Application
SCAN CHAIN LATCH DESIGN THAT IMPROVES TESTABILITY OF INTEGRATED CIR...
- Publication number 20160003902
- Publication date Jan 7, 2016
- International Business Machines Corporation
- Dzmitry S. Maliuk
- G01 - MEASURING TESTING
Information Patent Application
SCAN CHAIN LATCH DESIGN THAT IMPROVES TESTABILITY OF INTEGRATED CIR...
- Publication number 20140298128
- Publication date Oct 2, 2014
- International Business Machines Corporation
- Dzmitry Maliuk
- G01 - MEASURING TESTING