Eberhard Kurth

Person

Moritzburg, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Ion-sensitive structure and method for producing the same
- Patent number 10,365,244
- Issue date Jul 30, 2019
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Eberhard Kurth
- G01 - MEASURING TESTING
Information Patent Grant
Ion-sensitive layer structure for an ion-sensitive sensor and metho...
- Patent number 9,383,334
- Issue date Jul 5, 2016
- Endress+Hauser Conducta GmbH+Co. KG
- Christian Kunath
- G01 - MEASURING TESTING
Information Patent Grant
Ion-sensitive sensor with multilayer construction in the sensitive...
- Patent number 8,461,587
- Issue date Jun 11, 2013
- Endress + Hauser Conducta Gesellschaft für Mess-und Regeltechnik mbH + Co. KG
- Eberhard Kurth
- G01 - MEASURING TESTING
Information Patent Grant
Protective structure for semiconductor sensors
- Patent number 7,728,363
- Issue date Jun 1, 2010
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Stephan Sorge
- G01 - MEASURING TESTING
Information Patent Grant
Ion-sensitive field effect transistor and method for producing an i...
- Patent number 7,355,200
- Issue date Apr 8, 2008
- Fraunhofer-Gasellschaft zur Forderung der angewandten Forschung e.V.
- Eberhard Kurth
- G01 - MEASURING TESTING
Information Patent Grant
Ion-sensitive field effect transistor and method for producing an i...
- Patent number 7,321,143
- Issue date Jan 22, 2008
- Fraunhofer-Gesellschaft zur Forderun der Angewandten Forschung E.V.
- Christian Kunath
- G01 - MEASURING TESTING
Information Patent Grant
High energy, low energy density, radiation-resistant optics used wi...
- Patent number 6,891,655
- Issue date May 10, 2005
- Micronic Laser Systems AB
- Thomas J. Grebinski
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Circuit for measuring ion concentrations in solutions
- Patent number 5,602,467
- Issue date Feb 11, 1997
- Fraunhofer-Gesellschaft zur Foerderung der Angewandten Forschung E.V.
- Mathias Krauss
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SENSOR HAVING A SOLID-STATE LAYERED STRUCTURE, AND METHOD OF PRODUC...
- Publication number 20220244206
- Publication date Aug 4, 2022
- Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
- Eberhard KURTH
- G01 - MEASURING TESTING
Information Patent Application
ION-SENSITIVE STRUCTURE AND METHOD FOR PRODUCING THE SAME
- Publication number 20160274057
- Publication date Sep 22, 2016
- FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG e.V.
- Eberhard KURTH
- G01 - MEASURING TESTING
Information Patent Application
ION-SENSITIVE LAYER STRUCTURE FOR AN ION-SENSITIVE SENSOR AND METHO...
- Publication number 20150060953
- Publication date Mar 5, 2015
- Endress + Hauser Conducta Gesellschaft fur Mess- und Regeltechnik mbH + Co. KG
- Christian Kunath
- G01 - MEASURING TESTING
Information Patent Application
ION-SENSITIVE SENSOR WITH MULTILAYER CONSTRUCTION IN THE SENSITIVE...
- Publication number 20120018722
- Publication date Jan 26, 2012
- Endress + Hauser Conducta Gesellschaft fur Mess- und Regeltechnik mbH + Co. KG
- Eberhard Kurth
- G01 - MEASURING TESTING
Information Patent Application
PROTECTIVE STRUCTURE FOR SEMICONDUCTOR SENSORS
- Publication number 20080111161
- Publication date May 15, 2008
- Fraunhofer Gesellschaft zur Forderung der angewandten Forschung e.V.
- Stephan SORGE
- G01 - MEASURING TESTING
Information Patent Application
Ion-sensitive field effect transistor and method for producing an i...
- Publication number 20060035420
- Publication date Feb 16, 2006
- Christian Kunath
- G01 - MEASURING TESTING
Information Patent Application
Ion-sensitive field effect transistor and method for producing an i...
- Publication number 20050263798
- Publication date Dec 1, 2005
- Eberhard Kurth
- G01 - MEASURING TESTING
Information Patent Application
High energy, low energy density, radiation-resistant optics used wi...
- Publication number 20040130775
- Publication date Jul 8, 2004
- Micronic Laser Systems AB
- Thomas J. Grebinski
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Eberhard Kurth

Person

Patents Grantslast 30 patents

Ion-sensitive structure and method for producing the same

Ion-sensitive layer structure for an ion-sensitive sensor and metho...

Ion-sensitive sensor with multilayer construction in the sensitive...

Protective structure for semiconductor sensors

Ion-sensitive field effect transistor and method for producing an i...

Ion-sensitive field effect transistor and method for producing an i...

High energy, low energy density, radiation-resistant optics used wi...

Circuit for measuring ion concentrations in solutions

Patents Applicationslast 30 patents

SENSOR HAVING A SOLID-STATE LAYERED STRUCTURE, AND METHOD OF PRODUC...

ION-SENSITIVE STRUCTURE AND METHOD FOR PRODUCING THE SAME

ION-SENSITIVE LAYER STRUCTURE FOR AN ION-SENSITIVE SENSOR AND METHO...

ION-SENSITIVE SENSOR WITH MULTILAYER CONSTRUCTION IN THE SENSITIVE...

PROTECTIVE STRUCTURE FOR SEMICONDUCTOR SENSORS

Ion-sensitive field effect transistor and method for producing an i...

Ion-sensitive field effect transistor and method for producing an i...

High energy, low energy density, radiation-resistant optics used wi...