Eckehard Plättner

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Munchen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Electrical circuit and method for testing a circuit component of th...
- Patent number 6,701,473
- Issue date Mar 2, 2004
- Infineon Technologies AG
- Aaron Nygren
- G01 - MEASURING TESTING
Information Patent Grant
Redundancy concept for memory circuits having ROM memory cells
- Patent number 5,986,952
- Issue date Nov 16, 1999
- Siemens Aktiengesellschaft
- Roderick McConnell
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Integrated circuit having a synchronous and an asynchronous circuit...
- Publication number 20020067192
- Publication date Jun 6, 2002
- Heiko Fibranz
- G11 - INFORMATION STORAGE
Information Patent Application
Electrical circuit and method for testing a circuit component of th...
- Publication number 20020008538
- Publication date Jan 24, 2002
- Aaron Nygren
- G01 - MEASURING TESTING