Eddie Er

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Johor Bahru, MY

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Patents Grantslast 30 patents

Information Patent Grant
Method for a plan-view transmission electron microscopy sample prep...
- Patent number 6,683,304
- Issue date Jan 27, 2004
- Chartered Semiconductor Manufacturing Limited
- Dai Jiyan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR A PLAN-VIEW TRANSMISSION ELECTRON MICROSCOPY SAMPLE PREP...
- Publication number 20040004186
- Publication date Jan 8, 2004
- CHARTERED SEMICONDUCTOR MANUFACTURING LIMITED
- Dai Jiyan
- G01 - MEASURING TESTING