Eddie L Williamson

Person

Fort Collins, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and tester for verifying the electrical connection integrity...
- Patent number 7,737,701
- Issue date Jun 15, 2010
- Agilent Technologies, Inc.
- Eddie L Williamson
- G01 - MEASURING TESTING
Information Patent Grant
Method for using internal semiconductor junctions to aid in non-con...
- Patent number 7,327,148
- Issue date Feb 5, 2008
- Agilent Technologies, Inc.
- Myron J. Schneider
- G01 - MEASURING TESTING
Information Patent Grant
Method for using internal semiconductor junctions to aid in non-con...
- Patent number 7,242,198
- Issue date Jul 10, 2007
- Agilent Technologies, Inc.
- Myron J. Schneider
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting shorts on inaccessible pins usin...
- Patent number 7,075,307
- Issue date Jul 11, 2006
- Agilent Technologies, Inc.
- Eddie Williamson
- G01 - MEASURING TESTING
Information Patent Grant
Method for diagnosing open defects on non-contacted nodes of an ele...
- Patent number 7,057,395
- Issue date Jun 6, 2006
- Agilent Technologies, Inc.
- Eddie Williamson
- G01 - MEASURING TESTING
Information Patent Grant
Data accelerator and methods for increasing data throughput
- Patent number 6,826,721
- Issue date Nov 30, 2004
- Agilent Technoloiges, Inc.
- Eddie L. Williamson
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for adaptively learning test error sources to...
- Patent number 6,324,486
- Issue date Nov 27, 2001
- Agilent Technologies, Inc.
- David T. Crook
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit transfer test device system
- Patent number 4,779,041
- Issue date Oct 18, 1988
- Hewlett-Packard Company
- Eddie L. Williamson
- G01 - MEASURING TESTING
Information Patent Grant
Reversed IC test device and method
- Patent number 4,779,043
- Issue date Oct 18, 1988
- Hewlett-Packard Company
- Eddie L. Williamson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Printed circuit board for coupling probes to a tester, and apparatu...
- Publication number 20090179657
- Publication date Jul 16, 2009
- Eddie Lee Williamson
- G01 - MEASURING TESTING
Information Patent Application
Node Extender for In-Circuit Test Systems
- Publication number 20090091342
- Publication date Apr 9, 2009
- AGILENT TECHNOLOGIES, INC.
- Dennis L. Dyer
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND TESTER FOR VERIFYING THE ELECTRICAL CONNECTION INTEGRITY...
- Publication number 20090079440
- Publication date Mar 26, 2009
- AGILENT TECHNOLOGIES, INC.
- Eddie L Williamson
- G01 - MEASURING TESTING
Information Patent Application
Method for using internal semiconductor junctions to aid in non-con...
- Publication number 20070001688
- Publication date Jan 4, 2007
- Myron J. Schnelder
- G01 - MEASURING TESTING
Information Patent Application
Method for using internal semiconductor junctions to aid in non-con...
- Publication number 20070001687
- Publication date Jan 4, 2007
- Myron J. Schneider
- G01 - MEASURING TESTING
Information Patent Application
System and method for testing circuits and programming integrated c...
- Publication number 20030084388
- Publication date May 1, 2003
- Eddie L. Williamson
- G01 - MEASURING TESTING

Eddie L Williamson

Person

Patents Grantslast 30 patents

Method and tester for verifying the electrical connection integrity...

Method for using internal semiconductor junctions to aid in non-con...

Method for using internal semiconductor junctions to aid in non-con...

Method and apparatus for detecting shorts on inaccessible pins usin...

Method for diagnosing open defects on non-contacted nodes of an ele...

Data accelerator and methods for increasing data throughput

Method and apparatus for adaptively learning test error sources to...

Integrated circuit transfer test device system

Reversed IC test device and method

Patents Applicationslast 30 patents

Printed circuit board for coupling probes to a tester, and apparatu...

Node Extender for In-Circuit Test Systems

METHOD AND TESTER FOR VERIFYING THE ELECTRICAL CONNECTION INTEGRITY...

Method for using internal semiconductor junctions to aid in non-con...

Method for using internal semiconductor junctions to aid in non-con...

System and method for testing circuits and programming integrated c...