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Eddie Redmard
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Netanya, IL
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last 30 patents
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Patent Grant
Tj temperature calibration, measurement and control of semiconducto...
Patent number
9,006,000
Issue date
Apr 14, 2015
SanDisk Technologies Inc.
Deny Hanan
G01 - MEASURING TESTING
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Tj TEMPERATURE CALIBRATION, MEASUREMENT AND CONTROL OF SEMICONDUCTO...
Publication number
20130295697
Publication date
Nov 7, 2013
Deny Hanan
G01 - MEASURING TESTING