Edevaldo PEREIRA da SILVA JR.

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Campinas, BR

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Patents Grantslast 30 patents

Information Patent Grant
Production-test die temperature measurement method and apparatus
- Patent number 9,310,261
- Issue date Apr 12, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Ricardo P. Coimbra
- G01 - MEASURING TESTING
Information Patent Grant
Production-test die temperature measurement
- Patent number 9,074,943
- Issue date Jul 7, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Ricardo Pureza Coimbra
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically biased output structure
- Patent number 8,890,612
- Issue date Nov 18, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Ricardo Pureza Coimbra
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Die temperature sensor circuit
- Patent number 8,378,735
- Issue date Feb 19, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Edevaldo Pereira Da Silva
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PRODUCTION-TEST DIE TEMPERATURE MEASUREMENT METHOD AND APPARATUS
- Publication number 20150177075
- Publication date Jun 25, 2015
- FREESCALE SEMICONDUCTOR, INC.
- RICARDO P. COIMBRA
- G01 - MEASURING TESTING
Information Patent Application
PRODUCTION-TEST DIE TEMPERATURE MEASUREMENT
- Publication number 20140119405
- Publication date May 1, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Ricardo Pureza COIMBRA
- G01 - MEASURING TESTING
Information Patent Application
DYNAMICALLY BIASED OUTPUT STRUCTURE
- Publication number 20140111278
- Publication date Apr 24, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Ricardo Pureza COIMBRA
- H03 - BASIC ELECTRONIC CIRCUITRY