Edgar F. Steigmeier

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Hedingen, CH

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for surface inspections
- Patent number 5,377,002
- Issue date Dec 27, 1994
- Tet Techno Trust Investment Settlement
- Comas Malin
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting defects and dust on a patterned...
- Patent number 4,598,997
- Issue date Jul 8, 1986
- RCA Corporation
- Edgar F. Steigmeier
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the phase of phase transformable light scatt...
- Patent number 4,526,468
- Issue date Jul 2, 1985
- RCA Corporation
- Edgar F. Steigmeier
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the quality of light scattering material
- Patent number 4,391,524
- Issue date Jul 5, 1983
- RCA Corporation
- Edgar F. Steigmeier
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection system
- Patent number 4,314,763
- Issue date Feb 9, 1982
- RCA Corporation
- Edgar F. Steigmeier
- G01 - MEASURING TESTING