Edmundo de la Puente

Person

Cupertino, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Automated test equipment with hardware accelerator
- Patent number 12,079,098
- Issue date Sep 3, 2024
- Advantest Corporation
- Mei-Mei Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for providing UFS terminated and unterminated...
- Patent number 10,914,784
- Issue date Feb 9, 2021
- Advantest Corporation
- Andrew Chan
- G01 - MEASURING TESTING
Information Patent Grant
Testing memory devices with parallel processing operations
- Patent number 9,612,272
- Issue date Apr 4, 2017
- Advantest Corporation
- Xinguo Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Tester having an application specific electronics module, and syste...
- Patent number 9,557,372
- Issue date Jan 31, 2017
- Advantest Corporation
- Edmundo De La Puente
- G01 - MEASURING TESTING
Information Patent Grant
Distributed power supply architecture in automatic test equipment
- Patent number 9,453,883
- Issue date Sep 27, 2016
- Advantest Corporation
- Edmundo DeLaPuente
- G01 - MEASURING TESTING
Information Patent Grant
Testing memory devices with distributed processing operations
- Patent number 9,330,792
- Issue date May 3, 2016
- Advantest Corporation
- Xinguo Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Staged buffer caching in a system for testing a device under test
- Patent number 9,281,080
- Issue date Mar 8, 2016
- Advantest Corporation
- Michael Jones
- G11 - INFORMATION STORAGE
Information Patent Grant
Flexible test site synchronization
- Patent number 9,267,965
- Issue date Feb 23, 2016
- Advantest Corporation
- Michael Jones
- G01 - MEASURING TESTING
Information Patent Grant
Seamless fail analysis with memory efficient storage of fail lists
- Patent number 9,251,915
- Issue date Feb 2, 2016
- Advantest Corporation
- Hanh Lai
- G11 - INFORMATION STORAGE
Information Patent Grant
Parallel test circuit with active devices
- Patent number 8,384,410
- Issue date Feb 26, 2013
- Advantest (Singapore) Pte Ltd
- Edmundo De La Puente
- G01 - MEASURING TESTING
Information Patent Grant
Test system and method for testing electronic devices using a pipel...
- Patent number 8,347,156
- Issue date Jan 1, 2013
- Advantest (Singapore) Pte Ltd
- Erik H. Volkerink
- G01 - MEASURING TESTING
Information Patent Grant
Transmit/receive unit, and methods and apparatus for transmitting s...
- Patent number 8,242,796
- Issue date Aug 14, 2012
- Advantest (Singapore) Pte Ltd
- Edmundo de la Puente
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods and apparatus that selectively use or bypass a remote pin e...
- Patent number 7,928,755
- Issue date Apr 19, 2011
- Verigy (Singapore) Pte. Ltd.
- Edmundo de la Puente
- G01 - MEASURING TESTING
Information Patent Grant
Test system and method for testing electronic devices using a pipel...
- Patent number 7,743,304
- Issue date Jun 22, 2010
- Verigy (Singapore) Pte. Ltd.
- Erik H. Volkerink
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for testing a circuit
- Patent number 7,480,583
- Issue date Jan 20, 2009
- Verigy (Singapore) Pte. Ltd.
- Edmundo de la Puente
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods of allocating device testing resources to sites...
- Patent number 7,279,919
- Issue date Oct 9, 2007
- Verigy (Singapore) Pte. Ltd.
- Erik H. Volkerink
- G01 - MEASURING TESTING
Information Patent Grant
Resource matrix, system, and method for operating same
- Patent number 7,262,620
- Issue date Aug 28, 2007
- Verigy (Singapore) Pte. Ltd.
- Edmundo de la Puente
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory tester uses arbitrary dynamic mappings to serialize vectors...
- Patent number 7,076,714
- Issue date Jul 11, 2006
- Agilent Technologies, Inc.
- John H Cook, III
- G11 - INFORMATION STORAGE
Information Patent Grant
Algorithmically programmable memory tester with test sites operatin...
- Patent number 6,779,140
- Issue date Aug 17, 2004
- Agilent Technologies, Inc.
- Alan S Krech
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory tester tests multiple DUT's per test site
- Patent number 6,671,844
- Issue date Dec 30, 2003
- Agilent Technologies, Inc.
- Alan S Krech
- G11 - INFORMATION STORAGE
Information Patent Grant
Error catch RAM for memory tester has SDRAM memory sets configurabl...
- Patent number 6,320,812
- Issue date Nov 20, 2001
- Agilent Technologies, Inc.
- John H. Cook
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
PROCESSOR TEST PATTERN GENERATION AND APPLICATION FOR TESTER SYSTEMS
- Publication number 20240118340
- Publication date Apr 11, 2024
- Advantest Corporation
- Edmundo De La Puente
- G01 - MEASURING TESTING
Information Patent Application
LOW POWER ENVIRONMENT FOR HIGH PERFORMANCE PROCESSOR WITHOUT LOW PO...
- Publication number 20240094287
- Publication date Mar 21, 2024
- Advantest Corporation
- Edmundo De La Puente
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS OF TESTING DEVICES USING CXL FOR INCREASED PARA...
- Publication number 20240094293
- Publication date Mar 21, 2024
- Advantest Corporation
- Edmundo De La Puente
- G01 - MEASURING TESTING
Information Patent Application
MEMORY QUEUE OPERATIONS TO INCREASE THROUGHPUT IN AN ATE SYSTEM
- Publication number 20240096432
- Publication date Mar 21, 2024
- Advantest Corporation
- Edmundo de la Puente
- G11 - INFORMATION STORAGE
Information Patent Application
USE OF HOST BUS ADAPTER TO PROVIDE PROTOCOL FLEXIBILITY IN AUTOMATE...
- Publication number 20210117298
- Publication date Apr 22, 2021
- Advantest Corporation
- Mei-Mei SU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR PROVIDING UFS TERMINATED AND UNTERMINATED...
- Publication number 20200033405
- Publication date Jan 30, 2020
- Andrew CHAN
- G01 - MEASURING TESTING
Information Patent Application
STAGED BUFFER CACHING IN A SYSTEM FOR TESTING A DEVICE UNDER TEST
- Publication number 20150262705
- Publication date Sep 17, 2015
- Advantest Corporation
- Michael JONES
- G11 - INFORMATION STORAGE
Information Patent Application
DISTRIBUTED POWER SUPPLY ARCHITECTURE IN AUTOMATIC TEST EQUIPMENT
- Publication number 20150253378
- Publication date Sep 10, 2015
- Advantest Corporation
- Edmundo DeLaPuente
- G01 - MEASURING TESTING
Information Patent Application
TESTING MEMORY DEVICES WITH DISTRIBUTED PROCESSING OPERATIONS
- Publication number 20150243370
- Publication date Aug 27, 2015
- Advantest Corporation
- Xinguo ZHANG
- G11 - INFORMATION STORAGE
Information Patent Application
TESTING MEMORY DEVICES WITH PARALLEL PROCESSING OPERATIONS
- Publication number 20150243369
- Publication date Aug 27, 2015
- Advantest Corporation
- Xinguo ZHANG
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE TEST SITE SYNCHRONIZATION
- Publication number 20150137839
- Publication date May 21, 2015
- Advantest Corporation
- Michael JONES
- G01 - MEASURING TESTING
Information Patent Application
SEAMLESS FAIL ANALYSIS WITH MEMORY EFFICIENT STORAGE OF FAIL LISTS
- Publication number 20150135026
- Publication date May 14, 2015
- Advantest Corporation
- Hanh Lai
- G11 - INFORMATION STORAGE
Information Patent Application
TRANSMIT/RECEIVE UNIT, AND METHODS AND APPARATUS FOR TRANSMITTING S...
- Publication number 20150015284
- Publication date Jan 15, 2015
- ADVANTEST (SINGAPORE) PTE LTD
- Edmundo de la Puente
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TESTER HAVING AN APPLICATION SPECIFIC ELECTRONICS MODULE, AND SYSTE...
- Publication number 20140139251
- Publication date May 22, 2014
- Avantest (Singapore) PTE Ltd
- Edmundo De La Puente
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND METHOD FOR TESTING ELECTRONIC DEVICES USING A PIPEL...
- Publication number 20110145645
- Publication date Jun 16, 2011
- Verigy (Singapore) Pte. Ltd.
- Erik H. Volkerink
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND SYSTEMS FOR PROCESSING SIGNALS BETWEEN A TESTER AND A...
- Publication number 20110089966
- Publication date Apr 21, 2011
- Verigy (Singapore) Pte. Ltd.
- Romi Mayder
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS THAT SELECTIVELY USE OR BYPASS A REMOTE PIN E...
- Publication number 20090212799
- Publication date Aug 27, 2009
- Verigy (Singapore) Pte. Ltd.
- Edmundo de la Puente
- G01 - MEASURING TESTING
Information Patent Application
TRANSMIT/RECEIVE UNIT, AND METHODS AND APPARATUS FOR TRANSMITTING S...
- Publication number 20090212882
- Publication date Aug 27, 2009
- Verigy (Singapore) Pte. Ltd.
- Edmundo de la Puente
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHODS AND APPARATUS FOR TESTING A CIRCUIT
- Publication number 20080218173
- Publication date Sep 11, 2008
- Edmundo de la Puente
- G01 - MEASURING TESTING
Information Patent Application
Allocating device testing resources
- Publication number 20060158203
- Publication date Jul 20, 2006
- Erik H. Volkerink
- G01 - MEASURING TESTING
Information Patent Application
Memory tester uses arbitrary dynamic mappings to serialize vectors...
- Publication number 20040078740
- Publication date Apr 22, 2004
- John H. Cook
- G11 - INFORMATION STORAGE

Edmundo de la Puente

Person

Patents Grantslast 30 patents

Automated test equipment with hardware accelerator

Method and apparatus for providing UFS terminated and unterminated...

Testing memory devices with parallel processing operations

Tester having an application specific electronics module, and syste...

Distributed power supply architecture in automatic test equipment

Testing memory devices with distributed processing operations

Staged buffer caching in a system for testing a device under test

Flexible test site synchronization

Seamless fail analysis with memory efficient storage of fail lists

Parallel test circuit with active devices

Test system and method for testing electronic devices using a pipel...

Transmit/receive unit, and methods and apparatus for transmitting s...

Methods and apparatus that selectively use or bypass a remote pin e...

Test system and method for testing electronic devices using a pipel...

Methods and apparatus for testing a circuit

Systems and methods of allocating device testing resources to sites...

Resource matrix, system, and method for operating same

Memory tester uses arbitrary dynamic mappings to serialize vectors...

Algorithmically programmable memory tester with test sites operatin...

Memory tester tests multiple DUT&#x00027;s per test site

Error catch RAM for memory tester has SDRAM memory sets configurabl...

Patents Applicationslast 30 patents

PROCESSOR TEST PATTERN GENERATION AND APPLICATION FOR TESTER SYSTEMS

LOW POWER ENVIRONMENT FOR HIGH PERFORMANCE PROCESSOR WITHOUT LOW PO...

SYSTEMS AND METHODS OF TESTING DEVICES USING CXL FOR INCREASED PARA...

MEMORY QUEUE OPERATIONS TO INCREASE THROUGHPUT IN AN ATE SYSTEM

USE OF HOST BUS ADAPTER TO PROVIDE PROTOCOL FLEXIBILITY IN AUTOMATE...

METHOD AND APPARATUS FOR PROVIDING UFS TERMINATED AND UNTERMINATED...

STAGED BUFFER CACHING IN A SYSTEM FOR TESTING A DEVICE UNDER TEST

DISTRIBUTED POWER SUPPLY ARCHITECTURE IN AUTOMATIC TEST EQUIPMENT

TESTING MEMORY DEVICES WITH DISTRIBUTED PROCESSING OPERATIONS

TESTING MEMORY DEVICES WITH PARALLEL PROCESSING OPERATIONS

FLEXIBLE TEST SITE SYNCHRONIZATION

SEAMLESS FAIL ANALYSIS WITH MEMORY EFFICIENT STORAGE OF FAIL LISTS

TRANSMIT/RECEIVE UNIT, AND METHODS AND APPARATUS FOR TRANSMITTING S...

TESTER HAVING AN APPLICATION SPECIFIC ELECTRONICS MODULE, AND SYSTE...

TEST SYSTEM AND METHOD FOR TESTING ELECTRONIC DEVICES USING A PIPEL...

APPARATUS AND SYSTEMS FOR PROCESSING SIGNALS BETWEEN A TESTER AND A...

METHODS AND APPARATUS THAT SELECTIVELY USE OR BYPASS A REMOTE PIN E...

TRANSMIT/RECEIVE UNIT, AND METHODS AND APPARATUS FOR TRANSMITTING S...

METHODS AND APPARATUS FOR TESTING A CIRCUIT

Allocating device testing resources

Memory tester uses arbitrary dynamic mappings to serialize vectors...

Memory tester tests multiple DUT's per test site