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Edward A. Reitman
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Madison, NJ, US
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last 30 patents
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Patent Grant
Method for extracting process determinant conditions from a plurali...
Patent number
6,420,194
Issue date
Jul 16, 2002
Lucent Technologies Inc.
Edward Alois Reitman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Acoustic time of flight and acoustic resonance methods for detectin...
Patent number
6,367,329
Issue date
Apr 9, 2002
Agere Systems Guardian Corp.
Edward Alois Reitman
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for real time monitoring of wafer attributes i...
Patent number
5,654,903
Issue date
Aug 5, 1997
Lucent Technologies Inc.
Edward A. Reitman
G05 - CONTROLLING REGULATING