Edward A. Rietman

Person

Madison, Morris County, NJ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Carrier head with controllable struts for improved wafer planarity
- Patent number 6,402,590
- Issue date Jun 11, 2002
- Lucent Technologies Inc.
- Stephen A. Neston
- B24 - GRINDING POLISHING
Information Patent Grant
Dynamic data visualization
- Patent number 6,021,215
- Issue date Feb 1, 2000
- Lucent Technologies, Inc.
- Avinoam Kornblit
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Plasma etch end point detection process
- Patent number 5,877,407
- Issue date Mar 2, 1999
- Lucent Technologies Inc.
- Gardy Cadet
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Active neural network control of wafer attributes in a plasma etch...
- Patent number 5,737,496
- Issue date Apr 7, 1998
- Lucent Technologies Inc.
- Robert Charles Frye
- G05 - CONTROLLING REGULATING
Information Patent Grant
Active neural network determination of endpoint in a plasma etch pr...
- Patent number 5,653,894
- Issue date Aug 5, 1997
- Lucent Technologies Inc.
- Dale Edward Ibbotson
- G05 - CONTROLLING REGULATING
Information Patent Grant
Active neural network control of wafer attributes in a plasma etch...
- Patent number 5,467,883
- Issue date Nov 21, 1995
- AT&T Corp.
- Robert C. Frye
- G05 - CONTROLLING REGULATING
Information Patent Grant
Manufacturing adjustment during article fabrication
- Patent number 5,283,746
- Issue date Feb 1, 1994
- AT&T Bell Laboratories
- Kevin D. Cummings
- G06 - COMPUTING CALCULATING COUNTING

Edward A. Rietman

Person

Patents Grantslast 30 patents

Carrier head with controllable struts for improved wafer planarity

Dynamic data visualization

Plasma etch end point detection process

Active neural network control of wafer attributes in a plasma etch...

Active neural network determination of endpoint in a plasma etch pr...

Active neural network control of wafer attributes in a plasma etch...

Manufacturing adjustment during article fabrication