Edward C. Stewart

Person

Buda, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Dynamic tool scheduling based upon defects
- Patent number 7,720,559
- Issue date May 18, 2010
- Advanced Micro Devices, Inc.
- Edward C. Stewart
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for impasse detection and resolution
- Patent number 7,620,470
- Issue date Nov 17, 2009
- Advanced Micro Devices, Inc.
- Susan Hickey
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Dynamic maintenance of manufacturing system components
- Patent number 6,890,773
- Issue date May 10, 2005
- Advanced Micro Devices, Inc.
- Edward C. Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyzing error signals based on fault detection
- Patent number 6,850,811
- Issue date Feb 1, 2005
- Advanced Micro Devices, Inc.
- Edward C. Stewart
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for dynamically enabling trace data collection
- Patent number 6,766,258
- Issue date Jul 20, 2004
- Advanced Micro Devices, Inc.
- Edward C. Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring defects
- Patent number 6,754,593
- Issue date Jun 22, 2004
- Advanced Micro Devices, Inc.
- Edward C. Stewart
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for controlling focus based on a thickness of...
- Patent number 6,709,797
- Issue date Mar 23, 2004
- Advanced Micro Devices, Inc.
- Scott Bushman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for fault detection using multiple tool error...
- Patent number 6,563,300
- Issue date May 13, 2003
- Advanced Micro Devices, Inc.
- Timothy L. Jackson
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for controlling optical-parameters in a stepper
- Patent number 6,417,912
- Issue date Jul 9, 2002
- Advanced Micro Devices, Inc.
- Scott Bushman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Stepper with exposure time monitor
- Patent number 6,266,132
- Issue date Jul 24, 2001
- Advanced Micro Devices, Inc.
- Edward C. Stewart
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Edward C. Stewart

Person

Patents Grantslast 30 patents

Dynamic tool scheduling based upon defects

Method and apparatus for impasse detection and resolution

Dynamic maintenance of manufacturing system components

Analyzing error signals based on fault detection

Method and apparatus for dynamically enabling trace data collection

Method and apparatus for measuring defects

Method and apparatus for controlling focus based on a thickness of...

Method and apparatus for fault detection using multiple tool error...

Method and apparatus for controlling optical-parameters in a stepper

Stepper with exposure time monitor