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Edward Cyrankowski
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Woodbury, MN, US
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Patents Grants
last 30 patents
Information
Patent Grant
Testing assembly including a multiple degree of freedom stage
Patent number
12,140,571
Issue date
Nov 12, 2024
Bruker Nano, Inc.
Edward Cyrankowski
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Environmental conditioning mechanical test system
Patent number
12,000,802
Issue date
Jun 4, 2024
Bruker Nano, Inc.
Syed Amanulla Syed Asif
G01 - MEASURING TESTING
Information
Patent Grant
Testing assembly including a multiple degree of freedom stage
Patent number
11,237,087
Issue date
Feb 1, 2022
Bruker Nano, Inc.
Edward Cyrankowski
G01 - MEASURING TESTING
Information
Patent Grant
Testing assembly including a multiple degree of freedom stage
Patent number
10,663,380
Issue date
May 26, 2020
Bruker Nano, Inc.
Edward Cyrankowski
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
High temperature heating system
Patent number
9,804,072
Issue date
Oct 31, 2017
Hysitron, Inc.
Syed Amanulla Syed Asif
G01 - MEASURING TESTING
Information
Patent Grant
Micro electro-mechanical heater
Patent number
9,759,641
Issue date
Sep 12, 2017
Hysitron, Inc.
Yunje Oh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Testing assembly including a multiple degree of freedom stage
Patent number
9,472,374
Issue date
Oct 18, 2016
Hysitron, Inc.
Edward Cyrankowski
G01 - MEASURING TESTING
Information
Patent Grant
Micro electro-mechanical heater
Patent number
9,316,569
Issue date
Apr 19, 2016
Hysitron, Inc.
Yunje Oh
G01 - MEASURING TESTING
Information
Patent Grant
Three dimensional transducer
Patent number
8,844,366
Issue date
Sep 30, 2014
Hysitron, Inc.
Oden Lee Warren
G01 - MEASURING TESTING
Information
Patent Grant
Micro/nano-mechanical test system employing tensile test holder wit...
Patent number
8,789,425
Issue date
Jul 29, 2014
Hysitron Incorporated
Yunje Oh
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Actuatable capacitive transducer for quantitative nanoindentation c...
Patent number
8,453,498
Issue date
Jun 4, 2013
Hysitron, Inc.
Oden L. Warren
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Micro/nano-mechanical test system employing tensile test holder wit...
Patent number
8,434,370
Issue date
May 7, 2013
Hysitron Incorporated
Yunje Oh
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Actuatable capacitive transducer for quantitative nanoindentation c...
Patent number
7,798,011
Issue date
Sep 21, 2010
Hysitron, Inc.
Oden L. Warren
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Patents Applications
last 30 patents
Information
Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
Publication number
20250123192
Publication date
Apr 17, 2025
Bruker Nano, Inc.
Edward Cyrankowski
G01 - MEASURING TESTING
Information
Patent Application
ENVIRONMENTAL CONDITIONING MECHANICAL TEST SYSTEM
Publication number
20240319055
Publication date
Sep 26, 2024
Bruker Nano, Inc.
Syed Amanulla Syed Asif
G01 - MEASURING TESTING
Information
Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
Publication number
20220357251
Publication date
Nov 10, 2022
Bruker Nano, Inc.
Edward Cyrankowski
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
Publication number
20200408655
Publication date
Dec 31, 2020
Bruker Nano, Inc.
Edward Cyrankowski
G01 - MEASURING TESTING
Information
Patent Application
Environmental Conditioning Mechanical Test System
Publication number
20200284707
Publication date
Sep 10, 2020
Syed Amanulla Syed Asif
G01 - MEASURING TESTING
Information
Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
Publication number
20170030812
Publication date
Feb 2, 2017
HYSITRON, INC.
Edward Cyrankowski
G02 - OPTICS
Information
Patent Application
MICRO ELECTRO-MECHANICAL HEATER
Publication number
20160123859
Publication date
May 5, 2016
HYSITRON, INC.
Yunje Oh
G01 - MEASURING TESTING
Information
Patent Application
HIGH TEMPERATURE HEATING SYSTEM
Publication number
20150033835
Publication date
Feb 5, 2015
HYSITRON, INC.
Syed Amanulla Syed Asif
G01 - MEASURING TESTING
Information
Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
Publication number
20140231670
Publication date
Aug 21, 2014
HYSITRON, INC.
Edward Cyrankowski
G02 - OPTICS
Information
Patent Application
THREE DIMENSIONAL TRANSDUCER
Publication number
20140150562
Publication date
Jun 5, 2014
HYSITRON, INC.
Oden Lee Warren
G01 - MEASURING TESTING
Information
Patent Application
MICRO/NANO-MECHANICAL TEST SYSTEM EMPLOYING TENSILE TEST HOLDER WIT...
Publication number
20130247682
Publication date
Sep 26, 2013
Hysitron Inc.
Yunje Oh
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MICRO ELECTRO-MECHANICAL HEATER
Publication number
20120292528
Publication date
Nov 22, 2012
HYSITRON, INC.
Yunje Oh
G01 - MEASURING TESTING
Information
Patent Application
ACTUATABLE CAPACITIVE TRANSDUCER FOR QUANTITATIVE NANOINDENTATION C...
Publication number
20110005306
Publication date
Jan 13, 2011
Hysitron Incorporated
Oden L. Warren
G01 - MEASURING TESTING
Information
Patent Application
MICRO/NANO-MECHANICAL TEST SYSTEM EMPLOYING TENSILE TEST HOLDER WIT...
Publication number
20100095780
Publication date
Apr 22, 2010
Hysitron Incorporated
Yunje Oh
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ACTUATABLE CAPACITIVE TRANSDUCER FOR QUANTITATIVE NANOINDENTATION C...
Publication number
20070180924
Publication date
Aug 9, 2007
Oden L. Warren
G01 - MEASURING TESTING