Edward D. Adams

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Richmond, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of fabricating a nitrided silicon oxide gate dielectric layer
- Patent number 7,737,050
- Issue date Jun 15, 2010
- International Business Machines Corporation
- Edward Dennis Adams
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion implanter in-situ mass spectrometer
- Patent number 6,670,624
- Issue date Dec 30, 2003
- International Business Machines Corporation
- Edward D. Adams
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
In-line electrical monitor for measuring mechanical stress at the d...
- Patent number 6,649,429
- Issue date Nov 18, 2003
- International Business Machines Corporation
- Edward D. Adams
- G01 - MEASURING TESTING
Information Patent Grant
In-line electrical monitor for measuring mechanical stress at the d...
- Patent number 6,441,396
- Issue date Aug 27, 2002
- International Business Machines Corporation
- Edward D. Adams
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF FABRICATING A NITRIDED SILICON OXIDE GATE DIELECTRIC LAYER
- Publication number 20080102650
- Publication date May 1, 2008
- Edward Dennis Adams
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
In-line electrical monitor for measuring mechanical stress at the d...
- Publication number 20020190252
- Publication date Dec 19, 2002
- Edward D. Adams
- G01 - MEASURING TESTING