Edward D. Huber

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Bright field illumination system
- Patent number 5,825,495
- Issue date Oct 20, 1998
- Lockheed Martin Corporation
- Edward D. Huber
- G01 - MEASURING TESTING
Information Patent Grant
Laser inspection tool system
- Patent number 5,691,815
- Issue date Nov 25, 1997
- Lockheed Missiles & Space Co., Inc.
- Edward D. Huber
- G01 - MEASURING TESTING
Information Patent Grant
Vision inspection system and method
- Patent number 5,680,215
- Issue date Oct 21, 1997
- Lockheed Missiles & Space Company, Inc.
- Edward D. Huber
- G01 - MEASURING TESTING
Information Patent Grant
Contour measurement system
- Patent number 5,612,786
- Issue date Mar 18, 1997
- Lockheed Missiles & Space Company, Inc.
- Edward D. Huber
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional measurement device and system
- Patent number 5,561,526
- Issue date Oct 1, 1996
- Lockheed Missiles & Space Company, Inc.
- Edward D. Huber
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of calibrating a three-dimensional optical measurement system
- Patent number 5,557,410
- Issue date Sep 17, 1996
- Lockheed Missiles & Space Company, Inc.
- Edward D. Huber
- G06 - COMPUTING CALCULATING COUNTING