Edward E. Ehrichs

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Gate dielectrics of different thickness in PMOS and NMOS transistors
- Patent number 7,994,037
- Issue date Aug 9, 2011
- Advanced Micro Devices, Inc.
- Martin Trentzsch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High emissivity capacitor structure
- Patent number 7,223,615
- Issue date May 29, 2007
- Advanced Micro Devices, Inc.
- Edward E. Ehrichs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Simplified masking for asymmetric halo
- Patent number 7,144,782
- Issue date Dec 5, 2006
- Advanced Micro Devices, Inc.
- Edward E. Ehrichs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, system and apparatus to detect defects in semiconductor dev...
- Patent number 6,943,569
- Issue date Sep 13, 2005
- Advanced Micro Devices, Inc.
- Laura Pressley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Asymmetric halo implants
- Patent number 6,916,716
- Issue date Jul 12, 2005
- Advanced Micro Devices, Inc.
- Scott Goad
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor component and method of manufacture
- Patent number 6,806,111
- Issue date Oct 19, 2004
- Advanced Micro Devices, Inc.
- Edward E. Ehrichs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for asymmetric spacer formation
- Patent number 6,794,256
- Issue date Sep 21, 2004
- Advanced Micro Devices Inc.
- Mark B. Fuselier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for accurate alignment of integrated circuit i...
- Patent number 6,593,168
- Issue date Jul 15, 2003
- Advanced Micro Devices, Inc.
- Edward E. Ehrichs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for automated determination of reticle tilt in a lithographi...
- Patent number 6,522,776
- Issue date Feb 18, 2003
- Advanced Micro Devices, Inc.
- Edward E. Ehrichs
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor wafer review system and method
- Patent number 6,401,008
- Issue date Jun 4, 2002
- Advanced Micro Devices, Inc.
- Edward E. Ehrichs
- G01 - MEASURING TESTING
Information Patent Grant
Wafer edge polish
- Patent number 6,265,314
- Issue date Jul 24, 2001
- Advanced Micro Devices, Inc.
- Hang Thi Yen Black
- B24 - GRINDING POLISHING
Information Patent Grant
Method for determining the damage potential of the different types...
- Patent number 6,169,960
- Issue date Jan 2, 2001
- Advanced Micro Devices, Inc.
- Edward E. Ehrichs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer analysis system and method
- Patent number 6,156,580
- Issue date Dec 5, 2000
- Advanced Micro Devices, Inc.
- Chris Wooten
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
GATE DIELECTRICS OF DIFFERENT THICKNESS IN PMOS AND NMOS TRANSISTORS
- Publication number 20100025770
- Publication date Feb 4, 2010
- Martin Trentzsch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High emissivity capacitor structure
- Publication number 20040188801
- Publication date Sep 30, 2004
- Edward E. Ehrichs
- H01 - BASIC ELECTRIC ELEMENTS

Edward E. Ehrichs

Person

Patents Grantslast 30 patents

Gate dielectrics of different thickness in PMOS and NMOS transistors

High emissivity capacitor structure

Simplified masking for asymmetric halo

Method, system and apparatus to detect defects in semiconductor dev...

Asymmetric halo implants

Semiconductor component and method of manufacture

Method for asymmetric spacer formation

Method and apparatus for accurate alignment of integrated circuit i...

Method for automated determination of reticle tilt in a lithographi...

Semiconductor wafer review system and method

Wafer edge polish

Method for determining the damage potential of the different types...

Semiconductor wafer analysis system and method

Patents Applicationslast 30 patents

GATE DIELECTRICS OF DIFFERENT THICKNESS IN PMOS AND NMOS TRANSISTORS

High emissivity capacitor structure