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Edward E. Owen
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Nashua, NH, US
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last 30 patents
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Patent Grant
Dual-axis plasma imaging system for use in spectroscopic analysis
Patent number
5,642,190
Issue date
Jun 24, 1997
Thermo Jarrell Ash Corp.
Robert J. Krupa
G01 - MEASURING TESTING
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Patent Grant
Scanning monochromator
Patent number
5,096,295
Issue date
Mar 17, 1992
Imo Industries, Inc.
Robert J. Krupa
G01 - MEASURING TESTING