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Edward F. Hume
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Cincinnati, OH, US
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last 30 patents
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Patent Grant
Test circuit for a pulsed-laser detector
Patent number
5,365,055
Issue date
Nov 15, 1994
Cincinnati Microwave, Inc.
Lawrence G. Decker
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for pulsed-laser detection
Patent number
5,347,120
Issue date
Sep 13, 1994
Cincinnati Microwave, Inc.
Lawrence G. Decker
G01 - MEASURING TESTING
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Patent Grant
Pulsed-laser detection with pulse stretcher and noise averaging
Patent number
5,206,500
Issue date
Apr 27, 1993
Cincinnati Microwave, Inc.
Lawrence G. Decker
G01 - MEASURING TESTING