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Edward G. Pumphrey
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Colorado Springs, CO, US
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last 30 patents
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Patent Grant
System and method for adjusting a sampling time in a logic analyzer
Patent number
6,463,392
Issue date
Oct 8, 2002
Agilent Technologies, Inc.
Richard A. Nygaard
G01 - MEASURING TESTING
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Patent Grant
Programmable capacitance delay element having inverters controlled...
Patent number
5,283,631
Issue date
Feb 1, 1994
Hewlett-Packard Co.
Christopher Koerner
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring electrolytes utilizing optical signals rela...
Patent number
5,001,417
Issue date
Mar 19, 1991
Abbott Laboratories
John G. Pumphery
G01 - MEASURING TESTING
Information
Patent Grant
NMOS analog voltage comparator
Patent number
4,812,681
Issue date
Mar 14, 1989
Hewlett-Packard Company
Edward G. Pumphrey
G01 - MEASURING TESTING