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Edward Hill
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Huntingdon, GB
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Patents Grants
last 30 patents
Information
Patent Grant
Method and system for performing EDS analysis
Patent number
9,726,625
Issue date
Aug 8, 2017
Carl Zeiss Microscopy Ltd.
Edward Hill
G01 - MEASURING TESTING
Information
Patent Grant
Method for analyzing an object and charged particle beam device for...
Patent number
9,620,331
Issue date
Apr 11, 2017
Carl Zeiss Microscopy Ltd.
Sreenivas Bhattiprolu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of analyzing a sample and charged particle beam device for a...
Patent number
9,159,532
Issue date
Oct 13, 2015
Carl Zeiss Microscopy Ltd.
Edward Hill
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
GRAIN-BASED MINEROLOGY SEGMENTATION SYSTEM AND METHOD
Publication number
20250078205
Publication date
Mar 6, 2025
CARL ZEISS MICROSCOPY GMBH
Matthew Andrew
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
GRAIN-BASED MINEROLOGY SEGMENTATION SYSTEM AND METHOD
Publication number
20220397697
Publication date
Dec 15, 2022
CARL ZEISS MICROSCOPY GMBH
Matthew Andrew
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND SYSTEM FOR PERFORMING EDS ANALYSIS
Publication number
20160061754
Publication date
Mar 3, 2016
Carl Zeiss Microscopy Ltd.
Edward Hill
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF ANALYZING A SAMPLE AND CHARGED PARTICLE BEAM DEVICE FOR A...
Publication number
20140197310
Publication date
Jul 17, 2014
Edward Hill
G01 - MEASURING TESTING