Membership
Tour
Register
Log in
Edward J. Delawski
Follow
Person
Newark, DE, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Effect-particle orientation and apparatus therefor
Patent number
7,375,335
Issue date
May 20, 2008
E. I. Du Pont de Nemours and Company
Randall Allen Vogel
G01 - MEASURING TESTING
Information
Patent Grant
Wrap detection device
Patent number
5,964,391
Issue date
Oct 12, 1999
E. I. Du Pont de Nemours and Company
Terry Robin Cain
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
Etching of nanoscale structures
Patent number
5,210,425
Issue date
May 11, 1993
E. I. Du Pont de Nemours and Company
Edward J. Delawski
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
Effect-particle orientation and apparatus therefor
Publication number
20050083529
Publication date
Apr 21, 2005
Randall Allen Vogel
G01 - MEASURING TESTING
Information
Patent Application
YARN SENSOR
Publication number
20020000526
Publication date
Jan 3, 2002
EDWARD J. DELAWSKI
D02 - YARNS MECHANICAL FINISHING OF YARNS OR ROPES WARPING OR BEAMING