Edward J. Delawski

Person

  • Newark, DE, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Effect-particle orientation and apparatus therefor

    • Patent number 7,375,335
    • Issue date May 20, 2008
    • E. I. Du Pont de Nemours and Company
    • Randall Allen Vogel
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Wrap detection device

    • Patent number 5,964,391
    • Issue date Oct 12, 1999
    • E. I. Du Pont de Nemours and Company
    • Terry Robin Cain
    • B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
  • Information Patent Grant

    Etching of nanoscale structures

    • Patent number 5,210,425
    • Issue date May 11, 1993
    • E. I. Du Pont de Nemours and Company
    • Edward J. Delawski
    • B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

  • Information Patent Application

    Effect-particle orientation and apparatus therefor

    • Publication number 20050083529
    • Publication date Apr 21, 2005
    • Randall Allen Vogel
    • G01 - MEASURING TESTING
  • Information Patent Application

    YARN SENSOR

    • Publication number 20020000526
    • Publication date Jan 3, 2002
    • EDWARD J. DELAWSKI
    • D02 - YARNS MECHANICAL FINISHING OF YARNS OR ROPES WARPING OR BEAMING