Edward J. Merritt JR.

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Caledonia, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Automated optical surface profile measurement system
- Patent number 6,157,450
- Issue date Dec 5, 2000
- Chapman Instruments
- Silvio P. Marchese-Ragona
- G01 - MEASURING TESTING
Information Patent Grant
Viewing system for surface profiler
- Patent number 5,017,012
- Issue date May 21, 1991
- Chapman Instruments, Inc.
- Edward J. Merritt
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Breakaway/crash detection system for use with a fixture on a coordi...
- Publication number 20070151323
- Publication date Jul 5, 2007
- Edward J. Merritt
- G01 - MEASURING TESTING
Information Patent Application
Precision Z-axis mount for a lens assembly in an optical inspection...
- Publication number 20050024751
- Publication date Feb 3, 2005
- Optical Gaging Products, Inc.
- Edward J. Merritt
- G02 - OPTICS