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Edward L. Malantonio
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Conshohocken, PA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Cantilever probe structure for a probe card assembly
Patent number
8,004,299
Issue date
Aug 23, 2011
SV Probe Pte. Ltd.
Scott R. Williams
G01 - MEASURING TESTING
Information
Patent Grant
Probes for a wafer test apparatus
Patent number
7,808,260
Issue date
Oct 5, 2010
Kulicke and Soffa Industries, Inc.
Lich Thanh Tran
G01 - MEASURING TESTING
Information
Patent Grant
Approach for fabricating cantilever probes
Patent number
7,721,430
Issue date
May 25, 2010
SV Probe Pte. Ltd.
Dov Chartarifsky
G01 - MEASURING TESTING
Information
Patent Grant
Probe tip plating
Patent number
7,638,028
Issue date
Dec 29, 2009
SV Probe Pte. Ltd.
Bahadir Tunaboylu
G01 - MEASURING TESTING
Information
Patent Grant
Automated probe card planarization and alignment methods and tools
Patent number
7,583,098
Issue date
Sep 1, 2009
SV Probe Pte. Ltd.
Bahadir Tunaboylu
G01 - MEASURING TESTING
Information
Patent Grant
Method of shaping lithographically-produced probe elements
Patent number
7,462,800
Issue date
Dec 9, 2008
SV Probe Pte. Ltd.
Bahadir Tunaboylu
G01 - MEASURING TESTING
Information
Patent Grant
Probe repair methods
Patent number
7,437,813
Issue date
Oct 21, 2008
SV Probe Pte. Ltd.
Bahadir Tunaboylu
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for producing co-planar bonding pads on a subs...
Patent number
7,393,773
Issue date
Jul 1, 2008
SV Probe Pte. Ltd.
Edward L. Malantonio
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CANTILEVER PROBE STRUCTURE FOR A PROBE CARD ASSEMBLY
Publication number
20110148449
Publication date
Jun 23, 2011
Scott R. Williams
G01 - MEASURING TESTING
Information
Patent Application
Probes for a Wafer Test Apparatus
Publication number
20080258746
Publication date
Oct 23, 2008
Lich Thanh Tran
G01 - MEASURING TESTING
Information
Patent Application
Approach for fabricating cantilever probes
Publication number
20070256299
Publication date
Nov 8, 2007
Dov Chartarifsky
G01 - MEASURING TESTING
Information
Patent Application
Automated probe card planarization and alignment methods and tools
Publication number
20070216431
Publication date
Sep 20, 2007
Bahadir Tunaboylu
G01 - MEASURING TESTING
Information
Patent Application
Probe repair methods
Publication number
20070200577
Publication date
Aug 30, 2007
Bahadir Tunaboylu
G01 - MEASURING TESTING
Information
Patent Application
Multi-layered probes
Publication number
20070200576
Publication date
Aug 30, 2007
Edward T. Laurent
G01 - MEASURING TESTING
Information
Patent Application
Cantilever probe structure for a probe card assembly
Publication number
20070089551
Publication date
Apr 26, 2007
SV Probe Ptd. Ltd.
Scott R. Williams
G01 - MEASURING TESTING
Information
Patent Application
Method of shaping lithographically-produced probe elements
Publication number
20060119376
Publication date
Jun 8, 2006
K&S Interconnect, Inc.
Bahadir Tunaboylu
G01 - MEASURING TESTING
Information
Patent Application
Probe tip plating
Publication number
20060027747
Publication date
Feb 9, 2006
K&S Interconnect, Inc.
Bahadir Tunaboylu
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
Reinforced probes for testing semiconductor devices
Publication number
20060028220
Publication date
Feb 9, 2006
K&S Interconnect, Inc.
Edward L. Malantonio
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for producing co-planar bonding pads on a subs...
Publication number
20060022690
Publication date
Feb 2, 2006
K&S Interconnect, Inc.
Edward L. Malantonio
G01 - MEASURING TESTING