Edward McCloud

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Castro Valley, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Semi-automatic prober
- Patent number 12,135,335
- Issue date Nov 5, 2024
- QualiTau, Inc.
- Edward McCloud
- G01 - MEASURING TESTING
Information Patent Grant
Semi-automatic prober
- Patent number 11,175,309
- Issue date Nov 16, 2021
- QualiTau, Inc.
- Edward McCloud
- G01 - MEASURING TESTING
Information Patent Grant
Wafer temperature measurement tool
- Patent number 9,196,516
- Issue date Nov 24, 2015
- Qualitau, Inc.
- Edward McCloud
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe card and air cooled probe head system
- Patent number 7,126,361
- Issue date Oct 24, 2006
- QualiTau, Inc.
- Michael L. Anderson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMI-AUTOMATIC PROBER
- Publication number 20210396785
- Publication date Dec 23, 2021
- QualiTau, Inc.
- Edward MCCLOUD
- G01 - MEASURING TESTING
Information Patent Application
SEMI-AUTOMATIC PROBER
- Publication number 20160187377
- Publication date Jun 30, 2016
- QUALITAU, INC.
- Edward MCCLOUD
- G01 - MEASURING TESTING
Information Patent Application
WAFER TEMPERATURE MEASUREMENT TOOL
- Publication number 20140269822
- Publication date Sep 18, 2014
- QUALITAU, INC.
- Edward McCloud
- G01 - MEASURING TESTING